混响室中参考天线效率测量的振频效应

IF 2 3区计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-08-09 DOI:10.1109/TEMC.2024.3436704

Wei Xue;Yichao Yang;Siying Meng;Yan Yang;Tian Gao;Xiaoming Chen

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引用次数: 0

摘要

混响室（RC）已被证明是确定天线效率的有力技术。这封信主要介绍基于混响室的参考天线法（RAM）。由于 RC 内的宽带无线信道具有频率选择性，因此 RAM 在频率搅动（FS）情况下的统计行为与其他情况不同。然而，现有文献忽略了 FS 效应造成的差异。本研究建立了涉及 FS 的 RAM 统计模型，并通过测量进行了验证。结果发现，无论 FS 带宽如何，所提出的模型都能准确估计 RAM 的统计量，这表明 FS 效应已被充分考虑。这项工作的研究结果不仅对 RAM 的统计量进行了严格分析，而且还能准确确定 FS 参数。

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Frequency Stirring Effects on Reference Antenna Efficiency Measurements in Reverberation Chambers

The reverberation chamber (RC) has been proven to be a powerful technique to determine the antenna efficiency. This letter focuses on the RC-based reference antenna method (RAM). Since the broadband wireless channel within the RC is frequency selective, the statistical behavior of the RAM in cases of frequency stirring (FS) is different from the other cases. However, the differences caused by the FS effects have been overlooked in the existing literatures. In this work, a statistical model of the RAM involving with FS is established and verified by measurements. It is found that the proposed model provides an accurate estimation of the statistics of the RAM regardless of the FS bandwidth, indicating that the FS effects are fully considered. The findings of this work not only provide rigorous analyses of the statistics of the RAM but also allow accurate determinations of FS parameters.

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来源期刊

IEEE Transactions on Electromagnetic Compatibility 工程技术-电信学

CiteScore

4.80

自引率

19.00%

发文量

235

审稿时长

2.3 months

期刊介绍： IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.