分析 Ag M4,5 EELS 边缘以研究银纳米粒子腐蚀。

IF 1.5 4区 工程技术 Q3 MICROSCOPY
J C Brennan, D A MacLaren
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引用次数: 0

摘要

将从新鲜和腐蚀的银纳米粒子中收集到的电子能量损失光谱与一些参考材料中的电子能量损失光谱进行了比较,重点是 M4,5 边缘。描述了化学位移和边缘结构附近能量损失(ELNES)的变化,发现这些变化足以区分金属银和化学氧化银。测量结果与电子能量损失频谱成像相结合,可用于评估银纳米粒子的大气腐蚀机制。我们明确地将大气条件下的腐蚀产物定为硫化银,但显示反应过程明显不均匀,产生了各种类型的腐蚀颗粒。铺设说明:>在这里,我们使用分析电子显微镜跟踪纳米银颗粒的腐蚀过程,并展示了腐蚀产物的化学图谱。我们利用M4,5电子能量损失光谱特征显示了金属银和腐蚀银之间明显的光谱差异,而这种差异并不常见。我们的研究表明,腐蚀是由于与大气中的硫相互作用造成的;而且腐蚀并不均匀,似乎是从纳米粒子表面的特定点开始发展的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Analysis of the Ag M4,5 EELS edge to study silver nanoparticle corrosion.

Electron energy loss spectra collected from fresh and corroded silver nanoparticles are compared with those from a number of reference materials, focusing on the M4,5 edge. Chemical shifts and changes in the energy loss near edge structure (ELNES) are described and found to be sufficient to distinguish metallic silver from chemically oxidised silver. The measurements, in conjunction with electron energy loss spectrum imaging, are used to assess the mechanisms for atmospheric corrosion of silver nanoparticles. We unambiguously assign the corrosion product under atmospheric conditions to be silver sulphide, but show the reaction process to be distinctly inhomogeneous, producing a variety of types of corroded particles. LAY DESCRIPTION: >Here, we use analytical electron microscopy to track the corrosion of silver nanoparticles and present chemical maps of the corrosion products. We show clear spectroscopic differences between metallic and corroded silver using the M4,5 electron energy loss spectral feature, which is not commonly studied. Our study shows that corrosion is due to interactions with sulphur in the atmosphere; and the corrosion is not uniform, but appears to develop from specific points on the surface of the nanoparticles.

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来源期刊
Journal of microscopy
Journal of microscopy 工程技术-显微镜技术
CiteScore
4.30
自引率
5.00%
发文量
83
审稿时长
1 months
期刊介绍: The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.
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