利用透射 X 射线纳米衍射显微镜对薄膜的应力、变形和断裂进行现场表征。更正。

IF 2.5 3区物理与天体物理

Journal of Synchrotron Radiation Pub Date : 2024-09-01 Epub Date: 2024-08-06 DOI:10.1107/S1600577524006283

Gudrun Lotze, Anand H S Iyer, Olof Bäcke, Sebastian Kalbfleisch, Magnus Hörnqvist Colliander

引用次数: 0

摘要

Lotze 等人的文章[(2024). J. Synchrotron Rad. 31, 42-52]第 3.2 节中变量下标、公式和图 8 中的错误已更正。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy. Corrigendum.

Errors in variable subscripts, equations and Fig. 8 in Section 3.2 of the article by Lotze et al. [(2024). J. Synchrotron Rad. 31, 42-52] are corrected.

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来源期刊

Journal of Synchrotron Radiation INSTRUMENTS & INSTRUMENTATIONOPTICS&-OPTICS

CiteScore

5.60

自引率

12.00%

发文量

289

审稿时长

1 months

期刊介绍： Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.