基于 XRF 光谱特征因子并结合机器学习的土壤类型识别研究

IF 3.2 2区 化学 Q1 SPECTROSCOPY
Ying Wang , Tingting Gan , Nanjing Zhao , Gaofang Yin , Ziqi Ye , Ruoyu Sheng , Tanghu Li , Tianhong Liang , Renqing Jia , Li Fang , Xiang Hu , Xingchi Li
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引用次数: 0

摘要

土壤类型对使用 X 射线荧光 (XRF) 技术检测重金属的准确性有很大影响。快速、准确地识别土壤类型对于选择合适的 X 射线荧光土壤重金属定量分析方法,从而提高分析精度至关重要。本研究利用来自 10 种不同土壤类型的 26 个土壤样本,通过分析 XRF 光谱变化,提取了 13 个特征因子用于土壤类型鉴定。然后将这些因子与三种机器学习方法进行整合:随机森林(RF)、支持向量机(SVM)和反向传播神经网络(BPNN)。比较了这些方法在土壤类型鉴定中的有效性,突出了 XRF 光谱特征因子提取的重要性。结果表明,与全光谱 XRF 分析相比,基于从 XRF 光谱变化中提取特征因子的识别方法明显提高了识别的准确性、稳定性和速度。根据 XRF 特征因子光谱峰的总面积识别土壤类型时,三种机器学习方法--RF、SVM 和 BPNN 的准确率分别为 99.62%、99.04% 和 98.85%。随机森林的准确率最高(99.62%),运行速度最快(0.179 秒)。因此,通过提取 XRF 光谱的差异特征并结合机器学习方法,可以快速准确地识别和判断土壤类型。本研究证明了利用机器学习结合 XRF 光谱成功准确地识别了土壤类型,为今后利用 XRF 技术开发快速准确的土壤重金属现场检测设备奠定了重要的方法论基础。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Identification study of soil types based on feature factors of XRF spectrum combining with machine learning

Identification study of soil types based on feature factors of XRF spectrum combining with machine learning

Soil type significantly influences the detection accuracy of heavy metals using X-ray fluorescence (XRF) technology. Rapid and accurate soil type identification is crucial for selecting appropriate XRF quantitative analysis methods for soil heavy metals, thereby enhancing analysis accuracy. This study utilized 26 soil samples from 10 distinct soil types, extracting 13 feature factors for soil type identification by analyzing XRF spectral variability. These factors were then integrated with three machine learning methods: Random Forest (RF), Support Vector Machine (SVM), and Backpropagation Neural Network (BPNN). The effectiveness of these methods in soil type identification was compared, highlighting the importance of XRF spectral feature factor extraction. The results demonstrate that identification based on feature factor extraction from XRF spectral variability markedly improves identification accuracy, stability and speed compared to full-spectrum XRF analysis. When identifying soil types by the gross area of spectral peaks of XRF feature factors, the accuracies of three machine learning methods—RF, SVM, and BPNN—were 99.62%, 99.04%, and 98.85%, respectively. Random Forest achieved the highest accuracy (99.62%) and fastest operation speed (0.179 s). Therefore, by extracting the differential features of XRF spectra and combining them with machine learning methods, it is possible to quickly and accurately recognize and judge soil types. This study demonstrates the successful and accurate identification of soil types using machine learning combined with XRF spectroscopy.

It establishes an important methodological foundation for the future development of fast and accurate field testing equipment for soil heavy metals using XRF technology.

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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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