{"title":"基于模型的数字低压差稳压器动态负载调节性能极限研究","authors":"Yichen Xu;Zhaoqing Wang;Jonghyun Oh;Mingoo Seok","doi":"10.1109/TVLSI.2024.3425771","DOIUrl":null,"url":null,"abstract":"A digital low dropout (DLDO) regulator is one of the most critical building blocks in on-chip power management for its technology portability, voltage scalability, and other benefits associated with digital-oriented design. A key metric of DLDOs is the dynamic load regulation performance, often measured as the maximum current that a DLDO can quickly supply upon a significant load step under a voltage droop constraint (usually 10% of the output voltage). Previous works focused on architecture and circuit techniques to improve this metric. However, limited research focuses on the model development for the dynamic load regulation performance. To fill this gap, in this article, we propose the analytical models of the maximum load current of the standard DLDOs employing feedback and feedforward control laws. The developed models shed light on the impact of various design parameters on the total load current of a DLDO, with which both circuit and system designers can navigate the design space quickly and effectively.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":null,"pages":null},"PeriodicalIF":2.8000,"publicationDate":"2024-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Model-Based Study on the Limit of the Dynamic Load Regulation Performance of a Digital Low Dropout Regulator\",\"authors\":\"Yichen Xu;Zhaoqing Wang;Jonghyun Oh;Mingoo Seok\",\"doi\":\"10.1109/TVLSI.2024.3425771\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A digital low dropout (DLDO) regulator is one of the most critical building blocks in on-chip power management for its technology portability, voltage scalability, and other benefits associated with digital-oriented design. A key metric of DLDOs is the dynamic load regulation performance, often measured as the maximum current that a DLDO can quickly supply upon a significant load step under a voltage droop constraint (usually 10% of the output voltage). Previous works focused on architecture and circuit techniques to improve this metric. However, limited research focuses on the model development for the dynamic load regulation performance. To fill this gap, in this article, we propose the analytical models of the maximum load current of the standard DLDOs employing feedback and feedforward control laws. The developed models shed light on the impact of various design parameters on the total load current of a DLDO, with which both circuit and system designers can navigate the design space quickly and effectively.\",\"PeriodicalId\":13425,\"journal\":{\"name\":\"IEEE Transactions on Very Large Scale Integration (VLSI) Systems\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2024-07-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Very Large Scale Integration (VLSI) Systems\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10601616/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10601616/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
Model-Based Study on the Limit of the Dynamic Load Regulation Performance of a Digital Low Dropout Regulator
A digital low dropout (DLDO) regulator is one of the most critical building blocks in on-chip power management for its technology portability, voltage scalability, and other benefits associated with digital-oriented design. A key metric of DLDOs is the dynamic load regulation performance, often measured as the maximum current that a DLDO can quickly supply upon a significant load step under a voltage droop constraint (usually 10% of the output voltage). Previous works focused on architecture and circuit techniques to improve this metric. However, limited research focuses on the model development for the dynamic load regulation performance. To fill this gap, in this article, we propose the analytical models of the maximum load current of the standard DLDOs employing feedback and feedforward control laws. The developed models shed light on the impact of various design parameters on the total load current of a DLDO, with which both circuit and system designers can navigate the design space quickly and effectively.
期刊介绍:
The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society.
Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels.
To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.