弯曲晶体通道过程中的绝热不变式

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
N. P. Kalashnikov, A. S. Olchak
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引用次数: 0

摘要

摘要 我们考虑了弯曲单晶体中的通道效应。在伴随参考框架中,电子以与电子速度纵向分量相同的速度沿沟道平面或轴线运动,这种运动基本上实现了参数可控的一维(1D)原子或二维(2D)原子模型。通道平面或离子通道轴的电位深度和形状取决于晶体的化学成分、晶体结构和取向,以及在平面或轴向通道中运动的电子的能量。即使在弯曲的单晶体中,通道中的运动机制也能保持稳定。通过使用绝热运动不变量的表达式,可以估算出单晶体的最大弯曲角度,在该角度下,平面或轴向通道运动机制保持稳定。单晶体的最大弯曲角不应超过林德哈德通道的临界角,这就限制了使用弯曲单晶体使加速粒子束偏转到小角度的假设可能性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Adiabatic Invariants during Channeling in a Bent Crystal

We consider the channeling effect in a bent single crystal. In the accompanying reference frame moving along the plane or axis of channeling with the same velocity as the longitudinal component of the electron’s velocity, such motion essentially implements the model of a one-dimensional (1D) atom or a two-dimensional (2D) atom with controllable parameters. The depth and shape of the potential of the channeling plane or the ion channeling axis depend on the chemical composition, crystalline structure, and orientation of the crystal, as well as the energy of the electron moving in the planar or axial channel. The motion regime in the channel maintains stability even in a bent single crystal. By using expressions for adiabatic invariants of motion, the maximum bending angle of the single crystal is estimated at which motion in the plane or axial channeling regime retains stability. The maximum bending angle of the single crystal should not exceed the critical angle of Lindhard channeling, limiting the hypothetical possibility of using bent single crystals for deflecting beams of accelerated particles only to small angles.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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