E. A. Sviridova, S. V. Vasiliev, A. I. Limanovskii, V. N. Varyukhin, V. I. Tkatch
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引用次数: 0
摘要
摘要 利用 X 射线衍射确定的结构参数（相干散射域和晶格微应变的大小），在著名理论模型的框架内估算了晶界和位错机制对通过高压扭转技术加固薄金属箔而获得的纯铝样品的实验性强化的贡献。计算值与变形和老化样品的硬度之间存在良好的一致性，并讨论了在初始箔中出现差异的可能原因。研究还确定了变形和老化对铝箔和快速淬火铝95.8Mn3.8Fe0.4带材加固样品的相对贡献的影响。讨论了通过高压扭转处理的样品的结构特征以及结构参数和机械性能之间的关系。
Mechanisms of Strengthening Aluminum Foils Consolidated by the High-Pressure-Torsion Technique
The contributions of the grain boundary and dislocation mechanisms to the experimentally established strengthening of pure Al samples obtained by the consolidation of thin foils by the high-pressure-torsion technique are estimated within the framework of well-known theoretical models using structural parameters (sizes of coherently scattering domains and lattice microstrains) determined by X-ray diffraction. Good agreement between the calculated values and the hardness of the deformed and aged samples is found, and possible reasons for their differences in the initial foils are discussed. The influence of deformation and aging on the relative contributions of the analyzed mechanisms to the strengthening of samples consolidated from both Al foils and rapidly quenched Al95.8Mn3.8Fe0.4 ribbons is determined. The structural features of samples processed by high-pressure torsion and the relationship between the structural parameters and mechanical properties are discussed.
期刊介绍：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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