{"title":"关于 IXPE 的制作","authors":"M. Weisskopf, B. Ramsey","doi":"10.3390/galaxies12040038","DOIUrl":null,"url":null,"abstract":"Drs. Weisskopf and Ramsey were the original Principal and Deputy Principal Investigators of the Imaging X-ray Polarimetry Explorer (IXPE). They outline the path to the development of IXPE and discuss the technical and programmatic history that led up to the mission, a partnership between the Italian Space Agency and NASA, and the first fully dedicated to imaging X-ray polarimetry in the 2–8 keV band. An admittedly biased, as seen through the eyes of the original and Deputy Principal Investigators, technical overview of the development of the historical and critical scientific instrumentation is provided. The outstanding, and often paradigm-shifting results are presented in the papers following this one.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"7 3","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On the Making of IXPE\",\"authors\":\"M. Weisskopf, B. Ramsey\",\"doi\":\"10.3390/galaxies12040038\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Drs. Weisskopf and Ramsey were the original Principal and Deputy Principal Investigators of the Imaging X-ray Polarimetry Explorer (IXPE). They outline the path to the development of IXPE and discuss the technical and programmatic history that led up to the mission, a partnership between the Italian Space Agency and NASA, and the first fully dedicated to imaging X-ray polarimetry in the 2–8 keV band. An admittedly biased, as seen through the eyes of the original and Deputy Principal Investigators, technical overview of the development of the historical and critical scientific instrumentation is provided. The outstanding, and often paradigm-shifting results are presented in the papers following this one.\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":\"7 3\",\"pages\":\"\"},\"PeriodicalIF\":4.7000,\"publicationDate\":\"2024-07-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.3390/galaxies12040038\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3390/galaxies12040038","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
摘要
Weisskopf 博士和 Ramsey 博士是成像 X 射线偏振探测仪(IXPE)最初的首席和副首席研究员。他们概述了 IXPE 的发展之路,并讨论了促成这项任务的技术和计划历史。IXPE 是意大利航天局和美国国家航空航天局(NASA)的合作项目,也是首个完全致力于 2-8 keV 波段成像 X 射线偏振测量的项目。通过原首席研究员和副首席研究员的视角,对具有历史意义的关键科学仪器的发展历程进行了技术概述,这无疑有失偏颇。在本论文之后的论文中将介绍杰出的、往往是改变范式的成果。
Drs. Weisskopf and Ramsey were the original Principal and Deputy Principal Investigators of the Imaging X-ray Polarimetry Explorer (IXPE). They outline the path to the development of IXPE and discuss the technical and programmatic history that led up to the mission, a partnership between the Italian Space Agency and NASA, and the first fully dedicated to imaging X-ray polarimetry in the 2–8 keV band. An admittedly biased, as seen through the eyes of the original and Deputy Principal Investigators, technical overview of the development of the historical and critical scientific instrumentation is provided. The outstanding, and often paradigm-shifting results are presented in the papers following this one.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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