面向氮化镓基功率集成电路的新型滞后比较器电路设计

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
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引用次数: 0

摘要

本文针对基于氮化镓的功率集成电路,提出了一种采用由所有 N 型器件组成的正反馈回路的滞后比较器电路。通过将源极跟随器与比较器相结合,所提出的滞后比较器电路避免了对电阻器的依赖,从而提高了集成密度。为了证明所提电路的新颖性、可行性和优势,我们分别在 ADS 和 Cadence 中对基于氮化镓和硅的电路进行了仿真研究。通过使用台积电 180 纳米技术的 cadence virtuoso 工具进行仿真,该电路的布局面积为 171.08 μm2,低频信号增益为 55.74 dB,电源电压为 3.3 V 时的最大静态功耗为 364.6 μW;此外,根据 ADS 的仿真结果,在基于氮化镓的电路中,低频信号增益为 55.11 dB,过渡时间为 0.2 ns,电源电压为 12 V 时的最大静态功耗为 2.064 W。因此,在相同条件下,与其他主流电路或之前报道的电路相比,所提出的电路实现了更理想的工作性能和更小的体积,为在氮化镓基功率集成电路中单片集成滞后比较器电路提供了一种有利的策略。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A novel design of hysteretic comparator circuit towards GaN-based power IC

This paper proposes a hysteretic comparator circuit employing a positive feedback loop composed of all N-type devices towards GaN-based power integration circuits. By combining a source follower with comparator, the proposed hysteretic comparator circuit avoids the dependence on resistors, thus improving the integration density. To demonstrate the novelty, feasibility, and advantages of the proposed circuit, not only GaN-based but also Si-based circuits are investigated by simulations in ADS and Cadence, respectively. Simulated by the cadence virtuoso tool using TSMC 180 nm technology, it exhibits a layout area of 171.08 μm2, signal gain of 55.74 dB at low frequency, and maximum static power dissipation of 364.6 μW when the power supply is 3.3 V. In addition, it's verified that a signal gain of 55.11 dB at low frequency, transition time of 0.2 ns, and maximum static power dissipation of 2.064 W when the power supply is 12 V are achieved in GaN-based circuit according to simulation results in ADS. Consequently, compared with other mainstream or previously reported circuit in the same conditions, more ideal working performance and compact size are achieved by the proposed circuit, providing an advantageous strategy for monolithically integrating hysteretic comparator circuit in GaN-based power IC.

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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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