优化分离和 MC-ICP-MS 方法,以确定富含 Si- 和 Ba 的分馏火成岩和其他天然材料中的 Eu 同位素比率

IF 3.2 2区 化学 Q1 SPECTROSCOPY
Seung-Gu Lee
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引用次数: 0

摘要

使用 Sm 同位素对作为峰值进行归一化,可通过 MC-ICP-MS 精确测量 Eu 同位素比。标准化学试剂 NIST3117a 几乎不存在 Eu 同位素分馏现象,无论使用哪种 Sm 同位素对进行归一化。然而,由于 Gd 和 Ba 杂质、Sm 同位素对的干扰或使用不同的样品引入方法,即使是高纯度 Eu 化学试剂也会出现 Eu 同位素分馏。高度分馏的火成岩或长石矿物中的 Eu 同位素分馏可能是由不完全化学分离留下的 Gd 和 Ba 杂质引起的。本研究介绍了一种经过改进的最佳方法,用于准确和精确地测定高度分馏的富硅火成岩和富钡长石中的 Eu 同位素分馏程度。利用 MC-ICP-MS 监测了氧化钡对 Sm、Eu 和 Gd 同位素的影响,采用不同的湿法和干法等离子体条件引入样品。与钡杂质相比,钆杂质对 Eu 同位素比的影响更大。高度分馏的火成岩和长石材料显示出较轻的 Eu 同位素(151Eu)持续富集,相对于 NIST3117a 成为负 Eu 同位素值。结果表明,无论采用哪种 Sm 同位素对(如 147Sm149Sm、147Sm152Sm、147Sm154Sm、149Sm154Sm、150Sm154Sm)进行归一化,试剂中不含有可检测到的 Gd 和 Ba 的高纯度 Eu 溶液都能提供一致的 Eu 同位素值。为了获得不同地质材料(包括富含 Si- 和 Ba 的材料)中 Eu 同位素分馏的最佳估算值,必须完全去除 Ba 和 Gd 基质,并使用四个或更多 Sm 尖峰同位素对计算 Eu 同位素值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Optimization of separation and MC-ICP-MS methods for determining Eu isotopic ratios in Si- and Ba-rich fractionated igneous rocks and other natural materials

Optimization of separation and MC-ICP-MS methods for determining Eu isotopic ratios in Si- and Ba-rich fractionated igneous rocks and other natural materials

Eu isotope ratio can be precisely measured by MC-ICP-MS using a Sm isotope pair as spike for normalization. The standard chemical reagent NIST3117a exhibits almost no Eu isotope fractionation regardless of the kind of Sm isotope pairs used in normalization. However, Eu isotope fractionation can appear even in high purity Eu chemical reagents due to Gd and Ba impurities, interference with Sm isotope pair or use of different sample introduction methods. The Eu isotope fractionation in highly fractionated igneous rocks or feldspar minerals can arise from Gd and Ba impurities left by incomplete chemical separation. This study describes a modified, optimal method for accurately and precisely determining the degree of Eu isotope fractionation in highly fractionated Si-rich igneous rocks and Ba-rich feldspar. Ba oxide effects on Sm, Eu and Gd isotopes were monitored by MC-ICP-MS using different wet and dry plasma conditions for sample introduction. The Gd impurities exerts more influence than Ba impurities on Eu isotope ratios. The highly fractionated igneous rocks and feldspar materials showed consistent enrichment in the lighter Eu isotope (151Eu) which becomes a negative Eu isotopic value relative to NIST3117a. Results showed that highly purified Eu solutions from reagents containing no detectable Gd and Ba gave consistent Eu isotopic values regardless of Sm isotope pair (e.g., 147Sm149Sm, 147Sm152Sm, 147Sm154Sm, 149Sm154Sm, 150Sm154Sm) used in normalization. In order to obtain the best estimates of Eu isotope fractionation in different kinds of geological materials (including Si- and Ba-rich materials), Ba and Gd matrix must be completely removed and the Eu isotopic values calculated using four or more Sm spike isotope pairs.

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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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