{"title":"利用飞行时间二次离子质谱 (TOF-SIMS) 对 LaAl1-xCrxO3/SrTiO3 (x = 0、0.2、0.6 和 1)进行深度剖面研究","authors":"Manas Kumar Dalai, Gupteswar Samal, Trupti R. Das, Pramod Kumar, Geetanjali Sehgal, Anjana Dogra","doi":"10.1002/sia.7341","DOIUrl":null,"url":null,"abstract":"The conducting two‐dimensional electron gas (2DEG) behavior in LaAlO<jats:sub>3</jats:sub> (LAO)/SrTiO<jats:sub>3</jats:sub> (STO) and their associated mechanisms from various aspects have brought tremendous attention in the concerned area of research. To correlate the 2DEG behavior with their compositions, we have performed time of flight secondary ion mass spectrometry (TOF‐SIMS) depth profile analysis of thin films of Cr‐doped LAO/STO system as LaAl<jats:sub>1‐x</jats:sub>Cr<jats:sub>x</jats:sub>O<jats:sub>3</jats:sub> (<jats:italic>x</jats:italic> = 0, 0.2, 0.6 and 1) deposited over TiO<jats:sub>2</jats:sub> terminated STO substrate, which includes two parent compounds LAO/STO (metallic) and LCO/STO (insulating). The uniform decrease of La and Al concentration at the interface of LAO/STO (metallic) system and in the contrary the nonuniformity of La and Cr concentration in LCO/STO (insulating) system have been highlighted. The uniform variation of ionic concentration at the interface of LAO/STO may increase the career concentrations to make the system metallic. The upward and downward diffusion at the interfaces of intermediate compositions varies differently from their parent ones due to the mixing of Al and Cr. Our results may help to understand the conducting nature of LAO/STO system for future developments and applications in such system.","PeriodicalId":1,"journal":{"name":"Accounts of Chemical Research","volume":null,"pages":null},"PeriodicalIF":16.4000,"publicationDate":"2024-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Depth profile study of LaAl1‐xCrxO3/SrTiO3 (x = 0, 0.2, 0.6, and 1) using time of flight secondary ion mass spectrometry (TOF‐SIMS)\",\"authors\":\"Manas Kumar Dalai, Gupteswar Samal, Trupti R. Das, Pramod Kumar, Geetanjali Sehgal, Anjana Dogra\",\"doi\":\"10.1002/sia.7341\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The conducting two‐dimensional electron gas (2DEG) behavior in LaAlO<jats:sub>3</jats:sub> (LAO)/SrTiO<jats:sub>3</jats:sub> (STO) and their associated mechanisms from various aspects have brought tremendous attention in the concerned area of research. To correlate the 2DEG behavior with their compositions, we have performed time of flight secondary ion mass spectrometry (TOF‐SIMS) depth profile analysis of thin films of Cr‐doped LAO/STO system as LaAl<jats:sub>1‐x</jats:sub>Cr<jats:sub>x</jats:sub>O<jats:sub>3</jats:sub> (<jats:italic>x</jats:italic> = 0, 0.2, 0.6 and 1) deposited over TiO<jats:sub>2</jats:sub> terminated STO substrate, which includes two parent compounds LAO/STO (metallic) and LCO/STO (insulating). The uniform decrease of La and Al concentration at the interface of LAO/STO (metallic) system and in the contrary the nonuniformity of La and Cr concentration in LCO/STO (insulating) system have been highlighted. The uniform variation of ionic concentration at the interface of LAO/STO may increase the career concentrations to make the system metallic. The upward and downward diffusion at the interfaces of intermediate compositions varies differently from their parent ones due to the mixing of Al and Cr. Our results may help to understand the conducting nature of LAO/STO system for future developments and applications in such system.\",\"PeriodicalId\":1,\"journal\":{\"name\":\"Accounts of Chemical Research\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":16.4000,\"publicationDate\":\"2024-07-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Accounts of Chemical Research\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://doi.org/10.1002/sia.7341\",\"RegionNum\":1,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"CHEMISTRY, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Accounts of Chemical Research","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.1002/sia.7341","RegionNum":1,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
摘要
LaAlO3(LAO)/SrTiO3(STO)中的导电二维电子气(2DEG)行为及其相关机制从各个方面引起了相关研究领域的极大关注。为了将 2DEG 行为与它们的组成联系起来,我们对沉积在以二氧化钛为端基的 STO(包括两种母体化合物 LAO/STO(金属)和 LCO/STO(绝缘))上的掺铬 LAO/STO 系统薄膜进行了飞行时间二次离子质谱(TOF-SIMS)深度剖面分析。LAO/STO(金属)体系界面上 La 和 Al 的浓度均匀下降,相反,LCO/STO(绝缘)体系中 La 和 Cr 的浓度则不均匀。LAO/STO 界面上离子浓度的均匀变化可能会增加职业浓度,从而使系统具有金属特性。由于铝和铬的混合,中间成分界面上的向上和向下扩散与母体不同。我们的研究结果可能有助于了解 LAO/STO 系统的导电性质,从而促进此类系统的未来开发和应用。
Depth profile study of LaAl1‐xCrxO3/SrTiO3 (x = 0, 0.2, 0.6, and 1) using time of flight secondary ion mass spectrometry (TOF‐SIMS)
The conducting two‐dimensional electron gas (2DEG) behavior in LaAlO3 (LAO)/SrTiO3 (STO) and their associated mechanisms from various aspects have brought tremendous attention in the concerned area of research. To correlate the 2DEG behavior with their compositions, we have performed time of flight secondary ion mass spectrometry (TOF‐SIMS) depth profile analysis of thin films of Cr‐doped LAO/STO system as LaAl1‐xCrxO3 (x = 0, 0.2, 0.6 and 1) deposited over TiO2 terminated STO substrate, which includes two parent compounds LAO/STO (metallic) and LCO/STO (insulating). The uniform decrease of La and Al concentration at the interface of LAO/STO (metallic) system and in the contrary the nonuniformity of La and Cr concentration in LCO/STO (insulating) system have been highlighted. The uniform variation of ionic concentration at the interface of LAO/STO may increase the career concentrations to make the system metallic. The upward and downward diffusion at the interfaces of intermediate compositions varies differently from their parent ones due to the mixing of Al and Cr. Our results may help to understand the conducting nature of LAO/STO system for future developments and applications in such system.
期刊介绍:
Accounts of Chemical Research presents short, concise and critical articles offering easy-to-read overviews of basic research and applications in all areas of chemistry and biochemistry. These short reviews focus on research from the author’s own laboratory and are designed to teach the reader about a research project. In addition, Accounts of Chemical Research publishes commentaries that give an informed opinion on a current research problem. Special Issues online are devoted to a single topic of unusual activity and significance.
Accounts of Chemical Research replaces the traditional article abstract with an article "Conspectus." These entries synopsize the research affording the reader a closer look at the content and significance of an article. Through this provision of a more detailed description of the article contents, the Conspectus enhances the article's discoverability by search engines and the exposure for the research.