探索表面电荷动力学:二维材料中原子力显微镜高度测量的意义。

IF 2.6 4区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Beilstein Journal of Nanotechnology Pub Date : 2024-07-01 eCollection Date: 2024-01-01 DOI:10.3762/bjnano.15.64
Mario Navarro-Rodriguez, Andres M Somoza, Elisa Palacios-Lidon
{"title":"探索表面电荷动力学:二维材料中原子力显微镜高度测量的意义。","authors":"Mario Navarro-Rodriguez, Andres M Somoza, Elisa Palacios-Lidon","doi":"10.3762/bjnano.15.64","DOIUrl":null,"url":null,"abstract":"<p><p>An often observed artifact in atomic force microscopy investigations of individual monolayer flakes of 2D materials is the inaccurate height derived from topography images, often attributed to capillary or electrostatic forces. Here, we show the existence of a Joule dissipative mechanism related to charge dynamics and supplementing the dissipation due to capillary forces. This particular mechanism arises from the surface conductivity and assumes significance specially in the context of 2D materials on insulating supports. In such scenarios, the oscillating tip induces in-plane charge currents that in many circumstances constitute the main dissipative contribution to amplitude reduction and, consequently, affect the measured height. To investigate this phenomenon, we conduct measurements on monolayer flakes of co-deposited graphene oxide and reduced graphene oxide. Subsequently, we introduce a general model that elucidates our observations. This approach offers valuable insights into the dynamics of surface charges and their intricate interaction with the tip.</p>","PeriodicalId":8802,"journal":{"name":"Beilstein Journal of Nanotechnology","volume":null,"pages":null},"PeriodicalIF":2.6000,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11228822/pdf/","citationCount":"0","resultStr":"{\"title\":\"Exploring surface charge dynamics: implications for AFM height measurements in 2D materials.\",\"authors\":\"Mario Navarro-Rodriguez, Andres M Somoza, Elisa Palacios-Lidon\",\"doi\":\"10.3762/bjnano.15.64\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>An often observed artifact in atomic force microscopy investigations of individual monolayer flakes of 2D materials is the inaccurate height derived from topography images, often attributed to capillary or electrostatic forces. Here, we show the existence of a Joule dissipative mechanism related to charge dynamics and supplementing the dissipation due to capillary forces. This particular mechanism arises from the surface conductivity and assumes significance specially in the context of 2D materials on insulating supports. In such scenarios, the oscillating tip induces in-plane charge currents that in many circumstances constitute the main dissipative contribution to amplitude reduction and, consequently, affect the measured height. To investigate this phenomenon, we conduct measurements on monolayer flakes of co-deposited graphene oxide and reduced graphene oxide. Subsequently, we introduce a general model that elucidates our observations. This approach offers valuable insights into the dynamics of surface charges and their intricate interaction with the tip.</p>\",\"PeriodicalId\":8802,\"journal\":{\"name\":\"Beilstein Journal of Nanotechnology\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.6000,\"publicationDate\":\"2024-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11228822/pdf/\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Beilstein Journal of Nanotechnology\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.3762/bjnano.15.64\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"2024/1/1 0:00:00\",\"PubModel\":\"eCollection\",\"JCR\":\"Q3\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Beilstein Journal of Nanotechnology","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.3762/bjnano.15.64","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2024/1/1 0:00:00","PubModel":"eCollection","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

摘要

在对二维材料的单个单层薄片进行原子力显微镜研究时,经常会观察到一个假象,即从形貌图像中得出的高度不准确,这通常归因于毛细管力或静电力。在这里,我们展示了一种与电荷动力学相关的焦耳耗散机制的存在,并对毛细力导致的耗散进行了补充。这种特殊机制源于表面电导率,在绝缘支撑物上的二维材料中具有特殊意义。在这种情况下,振荡尖端会诱发面内电荷电流,在许多情况下,这些电荷电流是振幅降低的主要耗散因素,因此会影响测量高度。为了研究这一现象,我们对共沉积氧化石墨烯和还原氧化石墨烯的单层薄片进行了测量。随后,我们引入了一个通用模型来阐明我们的观察结果。这种方法为了解表面电荷的动态及其与尖端之间错综复杂的相互作用提供了宝贵的见解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Exploring surface charge dynamics: implications for AFM height measurements in 2D materials.

An often observed artifact in atomic force microscopy investigations of individual monolayer flakes of 2D materials is the inaccurate height derived from topography images, often attributed to capillary or electrostatic forces. Here, we show the existence of a Joule dissipative mechanism related to charge dynamics and supplementing the dissipation due to capillary forces. This particular mechanism arises from the surface conductivity and assumes significance specially in the context of 2D materials on insulating supports. In such scenarios, the oscillating tip induces in-plane charge currents that in many circumstances constitute the main dissipative contribution to amplitude reduction and, consequently, affect the measured height. To investigate this phenomenon, we conduct measurements on monolayer flakes of co-deposited graphene oxide and reduced graphene oxide. Subsequently, we introduce a general model that elucidates our observations. This approach offers valuable insights into the dynamics of surface charges and their intricate interaction with the tip.

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来源期刊
Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology NANOSCIENCE & NANOTECHNOLOGY-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
5.70
自引率
3.20%
发文量
109
审稿时长
2 months
期刊介绍: The Beilstein Journal of Nanotechnology is an international, peer-reviewed, Open Access journal. It provides a unique platform for rapid publication without any charges (free for author and reader) – Platinum Open Access. The content is freely accessible 365 days a year to any user worldwide. Articles are available online immediately upon publication and are publicly archived in all major repositories. In addition, it provides a platform for publishing thematic issues (theme-based collections of articles) on topical issues in nanoscience and nanotechnology. The journal is published and completely funded by the Beilstein-Institut, a non-profit foundation located in Frankfurt am Main, Germany. The editor-in-chief is Professor Thomas Schimmel – Karlsruhe Institute of Technology. He is supported by more than 20 associate editors who are responsible for a particular subject area within the scope of the journal.
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