0.450、3、6、9 和 15 MVp 高能 X 射线源特性分析

IF 2.6 3区材料科学 Q2 MATERIALS SCIENCE, CHARACTERIZATION & TESTING

Journal of Nondestructive Evaluation Pub Date : 2024-06-07 DOI:10.1007/s10921-024-01068-7

David Hellmann, Michael Liesenfelt, Jason P. Hayward

{"title":"0.450、3、6、9 和 15 MVp 高能 X 射线源特性分析","authors":"David Hellmann, Michael Liesenfelt, Jason P. Hayward","doi":"10.1007/s10921-024-01068-7","DOIUrl":null,"url":null,"abstract":"<div><p>As the availability and importance of high energy X-ray sources grows, accurate source characterizations provide critical information for field flatness corrections, beam hardening corrections, detector response corrections, and radiation shielding assessments. This study uses MCNP6.2 to create accurate high definition angular and energy dependent X-ray source definitions for the most common high energy industrial X-ray sources at 450 kVp, 3 MVp, 6 MVp, 9 MVp, and 15 MVp.</p></div>","PeriodicalId":655,"journal":{"name":"Journal of Nondestructive Evaluation","volume":"43 3","pages":""},"PeriodicalIF":2.6000,"publicationDate":"2024-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s10921-024-01068-7.pdf","citationCount":"0","resultStr":"{\"title\":\"High Energy X-Ray Source Characterization at 0.450, 3, 6, 9, and 15 MVp\",\"authors\":\"David Hellmann, Michael Liesenfelt, Jason P. Hayward\",\"doi\":\"10.1007/s10921-024-01068-7\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>As the availability and importance of high energy X-ray sources grows, accurate source characterizations provide critical information for field flatness corrections, beam hardening corrections, detector response corrections, and radiation shielding assessments. This study uses MCNP6.2 to create accurate high definition angular and energy dependent X-ray source definitions for the most common high energy industrial X-ray sources at 450 kVp, 3 MVp, 6 MVp, 9 MVp, and 15 MVp.</p></div>\",\"PeriodicalId\":655,\"journal\":{\"name\":\"Journal of Nondestructive Evaluation\",\"volume\":\"43 3\",\"pages\":\"\"},\"PeriodicalIF\":2.6000,\"publicationDate\":\"2024-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://link.springer.com/content/pdf/10.1007/s10921-024-01068-7.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Nondestructive Evaluation\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s10921-024-01068-7\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, CHARACTERIZATION & TESTING\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Nondestructive Evaluation","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1007/s10921-024-01068-7","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, CHARACTERIZATION & TESTING","Score":null,"Total":0}

引用次数: 0

摘要

随着高能 X 射线源的可用性和重要性不断增加，精确的源特征描述为场平整度校正、光束硬化校正、探测器响应校正和辐射屏蔽评估提供了关键信息。本研究使用 MCNP6.2 为最常见的 450 kVp、3 MVp、6 MVp、9 MVp 和 15 MVp 高能工业 X 射线源创建精确的高清角度和能量相关 X 射线源定义。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

High Energy X-Ray Source Characterization at 0.450, 3, 6, 9, and 15 MVp

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High Energy X-Ray Source Characterization at 0.450, 3, 6, 9, and 15 MVp

As the availability and importance of high energy X-ray sources grows, accurate source characterizations provide critical information for field flatness corrections, beam hardening corrections, detector response corrections, and radiation shielding assessments. This study uses MCNP6.2 to create accurate high definition angular and energy dependent X-ray source definitions for the most common high energy industrial X-ray sources at 450 kVp, 3 MVp, 6 MVp, 9 MVp, and 15 MVp.

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来源期刊

Journal of Nondestructive Evaluation 工程技术-材料科学：表征与测试

CiteScore

4.90

自引率

7.10%

发文量

审稿时长

9 months

期刊介绍： Journal of Nondestructive Evaluation provides a forum for the broad range of scientific and engineering activities involved in developing a quantitative nondestructive evaluation (NDE) capability. This interdisciplinary journal publishes papers on the development of new equipment, analyses, and approaches to nondestructive measurements.