利用亚纳秒 X 射线衍射技术研究 KISI-Kurchatov 上的光诱导偏振相关过程

IF 0.6 4区材料科学 Q4 CRYSTALLOGRAPHY

Crystallography Reports Pub Date : 2024-06-06 DOI:10.1134/S1063774524600170

M. V. Kovalchuk, E. I. Mareev, A. G. Kulikov, F. S. Pilyak, N. N. Obydennov, F. V. Potemkin, Yu. V. Pisarevsky, N. V. Marchenkov, A. E. Blagov

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引用次数: 0

摘要

摘要利用纳秒激光脉冲与 KISI-Kurchatov 同步辐射光束的同步，以小于 1 ns 的时间分辨率记录了铌铁锂晶体衍射峰 0012 的参数动态。激光脉冲（λ = 532 nm，τ = 4 ns，能量密度 0.6 J/cm2）在激光辐射的不同偏振方向上的影响会导致峰值强度的变化；这种变化取决于激光束偏振方向与晶体学轴线之间的角度。实验数据的小波分析对所获得的结果进行了补充。观察到的偏振依赖性与文献中有关光生伏打效应的数据相关。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

$Subnanosecond X-ray Diffraction Technique for the Study of Photoinduced Polarization-Dependent Processes on the KISI-Kurchatov$

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Subnanosecond X-ray Diffraction Technique for the Study of Photoinduced Polarization-Dependent Processes on the KISI-Kurchatov

The dynamics of the parameters of the diffraction peak 0012 of LiNbO₃:Fe crystals was recorded with a time resolution of less than 1 ns using synchronization of nanosecond laser pulses with synchrotron bunches of the KISI-Kurchatov source. The impact of a laser pulse (λ = 532 nm, τ = 4 ns, energy density 0.6 J/cm²) at different polarization directions of laser radiation causes a change in the peak intensity; this change depends on the angle between the laser beam polarization direction and the crystallographic axes. The obtained results are supplemented with the wavelet analysis of experimental data. The observed polarization dependence correlates with the data in the literature on the photovoltaic effect.

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来源期刊

Crystallography Reports 化学-晶体学

CiteScore

1.10

自引率

28.60%

发文量

审稿时长

4-8 weeks

期刊介绍： Crystallography Reports is a journal that publishes original articles short communications, and reviews on various aspects of crystallography: diffraction and scattering of X-rays, electrons, and neutrons, determination of crystal structure of inorganic and organic substances, including proteins and other biological substances; UV-VIS and IR spectroscopy; growth, imperfect structure and physical properties of crystals; thin films, liquid crystals, nanomaterials, partially disordered systems, and the methods of studies.