带全波电流传感器的单电感器多输出 DC-DC 转换器自适应零电流检测器

IF 2.8 2区工程技术 Q2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

IEEE Transactions on Very Large Scale Integration (VLSI) Systems Pub Date : 2024-07-01 DOI:10.1109/TVLSI.2024.3415475

Yichen Zhang;Chaowei Tang;Yanqi Zheng;Xian Tang;Ka Nang Leung

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引用次数: 0

摘要

本文介绍了一种自适应零电流检测器（ZCD），适用于带有全波电流传感器的单感应器多输出（SIMO）直流-直流转换器。该创新型自适应零电流检测器可应用于有序功率分配控制（OPDC）SIMO DC-DC 转换器，当 SIMO DC-DC 转换器工作在不连续导通模式时，它能准确地关闭低侧电源开关。此外，还提出了一种仅包含一个传感晶体管的新型全波电流传感器，它能以较小的延迟精确感测电感器电流。SIMO DC-DC 转换器采用标准 65 纳米 CMOS 工艺设计和制造，输出功率范围为 3.7 至 925 mW。测量的反向电流降低了 78.2%，测量的轻载功率效率提高了 10%。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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An Adaptive Zero-Current Detector for Single-Inductor Multiple-Output DC-DC Converter With Full-Wave Current Sensor

This brief presents an adaptive zero-current detector (ZCD) for the single-inductor multiple-output (SIMO) DC-DC converter with a full-wave current sensor. The innovative adaptive ZCD, which can be applied to the order power distribution control (OPDC) SIMO DC-DC converter, is designed, and it can accurately turn off the low-side power switch when the SIMO DC-DC converter operates in the discontinuous conduction mode. Besides, a new full-wave current sensor which contains only one sensing transistor is presented, and it can precisely sense the inductor current with a small delay. The SIMO DC-DC converter is designed and fabricated in a standard 65 nm CMOS process with output power ranges from 3.7 to 925 mW. The measured reverse current is reduced by up to 78.2%, and the measured light-load power efficiency is improved by up to 10%.

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来源期刊

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 工程技术-工程：电子与电气

CiteScore

6.40

自引率

7.10%

发文量

187

审稿时长

3.6 months

期刊介绍： The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society. Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels. To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.