{"title":"模式分离 MEMS 陀螺仪偏差不稳定性噪声的根本原因","authors":"Miloš Vujadinović;Tobias Hiller;Thorsten Balslink;Mourad Elsobky;Lukas Blocher;Alexander Buhmann;Thomas Northemann;Bhaskar Choubey","doi":"10.1109/JMEMS.2024.3406584","DOIUrl":null,"url":null,"abstract":"This paper presents a general instability model of mode-split MEMS gyroscopes. The proposed model can accurately predict the bias instability of a given device based on the applied angular rate and system parameters. The model consists of two noise models: bias instability and scale factor instability. Four flicker noise sources are considered that are the most significant contributors. These include phase flicker noise of the drive capacitance to voltage converter, sense analog-to-digital (ADC) scale factor instability, proof mass voltage flicker noise, and additive flicker noise. All the noise contributors are thoroughly analyzed and experimentally characterized on four triaxial research devices. Based on the results of the experimental characterization, the proposed scale factor and bias instability models are verified against the measurement data. We find a good match between the presented model and measurements. As anticipated by the proposed model, a reduction of the phase flicker noise of the drive capacitance to voltage converter has led to up to 50% improvement in bias instability.[2024-0018]","PeriodicalId":16621,"journal":{"name":"Journal of Microelectromechanical Systems","volume":"33 5","pages":"514-523"},"PeriodicalIF":2.5000,"publicationDate":"2024-06-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Root-Causes of Bias Instability Noise in Mode-Split MEMS Gyroscopes\",\"authors\":\"Miloš Vujadinović;Tobias Hiller;Thorsten Balslink;Mourad Elsobky;Lukas Blocher;Alexander Buhmann;Thomas Northemann;Bhaskar Choubey\",\"doi\":\"10.1109/JMEMS.2024.3406584\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a general instability model of mode-split MEMS gyroscopes. The proposed model can accurately predict the bias instability of a given device based on the applied angular rate and system parameters. The model consists of two noise models: bias instability and scale factor instability. Four flicker noise sources are considered that are the most significant contributors. These include phase flicker noise of the drive capacitance to voltage converter, sense analog-to-digital (ADC) scale factor instability, proof mass voltage flicker noise, and additive flicker noise. All the noise contributors are thoroughly analyzed and experimentally characterized on four triaxial research devices. Based on the results of the experimental characterization, the proposed scale factor and bias instability models are verified against the measurement data. We find a good match between the presented model and measurements. As anticipated by the proposed model, a reduction of the phase flicker noise of the drive capacitance to voltage converter has led to up to 50% improvement in bias instability.[2024-0018]\",\"PeriodicalId\":16621,\"journal\":{\"name\":\"Journal of Microelectromechanical Systems\",\"volume\":\"33 5\",\"pages\":\"514-523\"},\"PeriodicalIF\":2.5000,\"publicationDate\":\"2024-06-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Microelectromechanical Systems\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10571924/\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Microelectromechanical Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10571924/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Root-Causes of Bias Instability Noise in Mode-Split MEMS Gyroscopes
This paper presents a general instability model of mode-split MEMS gyroscopes. The proposed model can accurately predict the bias instability of a given device based on the applied angular rate and system parameters. The model consists of two noise models: bias instability and scale factor instability. Four flicker noise sources are considered that are the most significant contributors. These include phase flicker noise of the drive capacitance to voltage converter, sense analog-to-digital (ADC) scale factor instability, proof mass voltage flicker noise, and additive flicker noise. All the noise contributors are thoroughly analyzed and experimentally characterized on four triaxial research devices. Based on the results of the experimental characterization, the proposed scale factor and bias instability models are verified against the measurement data. We find a good match between the presented model and measurements. As anticipated by the proposed model, a reduction of the phase flicker noise of the drive capacitance to voltage converter has led to up to 50% improvement in bias instability.[2024-0018]
期刊介绍:
The topics of interest include, but are not limited to: devices ranging in size from microns to millimeters, IC-compatible fabrication techniques, other fabrication techniques, measurement of micro phenomena, theoretical results, new materials and designs, micro actuators, micro robots, micro batteries, bearings, wear, reliability, electrical interconnections, micro telemanipulation, and standards appropriate to MEMS. Application examples and application oriented devices in fluidics, optics, bio-medical engineering, etc., are also of central interest.