设计和验证 SAR ADC 系统 Verilog 实数模型

Nikolaos Georgoulopoulos, Theodora Mamali, Alkis Hatzopoulos
{"title":"设计和验证 SAR ADC 系统 Verilog 实数模型","authors":"Nikolaos Georgoulopoulos, Theodora Mamali, Alkis Hatzopoulos","doi":"10.1007/s10836-024-06124-8","DOIUrl":null,"url":null,"abstract":"<p>Mixed-signal applications have emerged as a significant trend in the semiconductor industry, with considerable efforts directed towards developing fast and accurate designs that integrate both analog and digital components. However, mixed-signal verification presents a major challenge due to the slow verification time and limited robustness of traditional verification techniques. In this study, a verification architecture for a successive-approximation register (SAR) analog-to-digital converter (ADC) real number model (Real Number Modeling – RNM) using SystemVerilog is presented, which utilizes an efficient UVM-based methodology. The proposed approach combines the UVM capabilities with the RNM model of the SAR ADC to generate a reusable, fast, and robust verification environment with a reduced time-to-market. The testbench creation and simulation were carried out using Cadence Xcelium. The proposed verification architecture employs constrained-random stimulus generation, analog assertions, and coverage metrics to enhance verification effectiveness. Additionally, aim of this work is to emphasize on the RNM efficiency with SystemVerilog, and apply its modeling capabilities for a SAR ADC. The presented real number model was compared to a Verilog-AMS model. The conducted experiments provided evidence that the proposed RNM model exhibits a significant improvement in simulation efficiency compared to previous works documented in the literature (simulation time was at 0.5 s, compared to a Verilog-AMS reference model’s simulation at 20 s). This improvement in efficiency is achieved without compromising on the accuracy of the simulation, ensuring that the model maintains a satisfactory level of precision.</p>","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"1 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design and Verification of a SAR ADC SystemVerilog Real Number Model\",\"authors\":\"Nikolaos Georgoulopoulos, Theodora Mamali, Alkis Hatzopoulos\",\"doi\":\"10.1007/s10836-024-06124-8\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Mixed-signal applications have emerged as a significant trend in the semiconductor industry, with considerable efforts directed towards developing fast and accurate designs that integrate both analog and digital components. However, mixed-signal verification presents a major challenge due to the slow verification time and limited robustness of traditional verification techniques. In this study, a verification architecture for a successive-approximation register (SAR) analog-to-digital converter (ADC) real number model (Real Number Modeling – RNM) using SystemVerilog is presented, which utilizes an efficient UVM-based methodology. The proposed approach combines the UVM capabilities with the RNM model of the SAR ADC to generate a reusable, fast, and robust verification environment with a reduced time-to-market. The testbench creation and simulation were carried out using Cadence Xcelium. The proposed verification architecture employs constrained-random stimulus generation, analog assertions, and coverage metrics to enhance verification effectiveness. Additionally, aim of this work is to emphasize on the RNM efficiency with SystemVerilog, and apply its modeling capabilities for a SAR ADC. The presented real number model was compared to a Verilog-AMS model. The conducted experiments provided evidence that the proposed RNM model exhibits a significant improvement in simulation efficiency compared to previous works documented in the literature (simulation time was at 0.5 s, compared to a Verilog-AMS reference model’s simulation at 20 s). This improvement in efficiency is achieved without compromising on the accuracy of the simulation, ensuring that the model maintains a satisfactory level of precision.</p>\",\"PeriodicalId\":501485,\"journal\":{\"name\":\"Journal of Electronic Testing\",\"volume\":\"1 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Electronic Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/s10836-024-06124-8\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronic Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s10836-024-06124-8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

混合信号应用已成为半导体行业的一个重要趋势,人们正努力开发集成模拟和数字元件的快速准确设计。然而,由于传统验证技术的验证时间慢、鲁棒性有限,混合信号验证面临着巨大挑战。在本研究中,介绍了一种使用 SystemVerilog 的逐次逼近寄存器 (SAR) 模数转换器 (ADC) 实数模型(实数建模 - RNM)的验证架构,它采用了一种基于 UVM 的高效方法。所提出的方法将 UVM 功能与 SAR ADC 的 RNM 模型相结合,生成了一个可重复使用、快速、稳健的验证环境,缩短了产品上市时间。测试平台的创建和仿真使用 Cadence Xcelium 进行。拟议的验证架构采用了受限随机刺激生成、模拟断言和覆盖率指标,以提高验证的有效性。此外,这项工作的目的是强调 SystemVerilog 的 RNM 效率,并将其建模功能应用于 SAR ADC。所提出的实数模型与 Verilog-AMS 模型进行了比较。实验结果表明,与文献中记载的先前作品相比,所提出的 RNM 模型在仿真效率方面有显著提高(仿真时间为 0.5 秒,而 Verilog-AMS 参考模型的仿真时间为 20 秒)。在提高仿真效率的同时,并没有降低仿真精度,从而确保了模型保持令人满意的精度水平。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Design and Verification of a SAR ADC SystemVerilog Real Number Model

Design and Verification of a SAR ADC SystemVerilog Real Number Model

Mixed-signal applications have emerged as a significant trend in the semiconductor industry, with considerable efforts directed towards developing fast and accurate designs that integrate both analog and digital components. However, mixed-signal verification presents a major challenge due to the slow verification time and limited robustness of traditional verification techniques. In this study, a verification architecture for a successive-approximation register (SAR) analog-to-digital converter (ADC) real number model (Real Number Modeling – RNM) using SystemVerilog is presented, which utilizes an efficient UVM-based methodology. The proposed approach combines the UVM capabilities with the RNM model of the SAR ADC to generate a reusable, fast, and robust verification environment with a reduced time-to-market. The testbench creation and simulation were carried out using Cadence Xcelium. The proposed verification architecture employs constrained-random stimulus generation, analog assertions, and coverage metrics to enhance verification effectiveness. Additionally, aim of this work is to emphasize on the RNM efficiency with SystemVerilog, and apply its modeling capabilities for a SAR ADC. The presented real number model was compared to a Verilog-AMS model. The conducted experiments provided evidence that the proposed RNM model exhibits a significant improvement in simulation efficiency compared to previous works documented in the literature (simulation time was at 0.5 s, compared to a Verilog-AMS reference model’s simulation at 20 s). This improvement in efficiency is achieved without compromising on the accuracy of the simulation, ensuring that the model maintains a satisfactory level of precision.

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