Z. Y. Liu, J. Song, K. Yu, J. J. Zhou, G. R. Guo, X. P. Hao
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引用次数: 0
摘要
为了实现大气下固体材料光谱发射率的精确定向测定，我们开发了一种仪器，其温度范围为 50 ℃ 至 1000 ℃，光谱范围为 3 μm 至 14 μm。测量角度可通过步进旋转台从 0° 调整到 60°。通过测量碳化硅样品在高温下的光谱发射率，证实了该仪器的可靠性。此外，还研究了从 50 °C 到 1000 °C 的 SiC 正常光谱发射率，以及 600 °C 和 800 °C 时的定向光谱发射率。详细分析了温度和测量角度对碳化硅光谱发射率的影响。此外，还探讨了高温加热后碳化硅表面形成二氧化硅膜的原因及其对光谱发射率的影响。最后，详细分析了不同温度和波长下发射率测量的不确定性成分，结果表明仪器在测量范围内的不确定性优于 0.05。
Development of An Apparatus for the Directional Spectral Emissivity Measurement from 50 ℃ to 1000 ℃
To realize precise directional spectral emissivity determination of solid materials under the atmosphere, an apparatus what covers the temperature region from 50 °C to 1000 °C and a spectral range of 3 μm–14 μm was developed. The measurement angle can be adjusted from 0° to 60° utilizing a stepper rotary stage. The reliability of the apparatus’s reliability was confirmed by measuring the spectral emissivity of a SiC sample at high temperatures. Furthermore, the normal spectral emissivity of SiC was investigated from 50 °C to 1000 °C, and the directional spectral emissivity at 600 °C and 800 °C was shown. The influence of temperature and measurement angle on the spectral emissivity of SiC was analyzed in detail. Additionally, the cause of the silicon dioxide film on the surface of SiC after high temperature heating and its influence on spectral emissivity were explored. Finally, a detailed analysis of the uncertainty components of the emissivity measurement under varying temperatures and wavelengths was performed, and the results showed that the uncertainty of the apparatus was better than 0.05 in its measurement range.
期刊介绍：
International Journal of Thermophysics serves as an international medium for the publication of papers in thermophysics, assisting both generators and users of thermophysical properties data. This distinguished journal publishes both experimental and theoretical papers on thermophysical properties of matter in the liquid, gaseous, and solid states (including soft matter, biofluids, and nano- and bio-materials), on instrumentation and techniques leading to their measurement, and on computer studies of model and related systems. Studies in all ranges of temperature, pressure, wavelength, and other relevant variables are included.
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