在不同样品温度条件下利用无校准激光诱导击穿光谱分析铝锡铜合金

IF 3.2 2区化学 Q1 SPECTROSCOPY

Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2024-06-19 DOI:10.1016/j.sab.2024.106976

Ran Hai , Xueyan Wang , Xue Bai , Zhonglin He , Ding Wu , Cong Li , Hongbin Ding , Xuefeng Yao

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引用次数: 0

摘要

本研究调查了样品温度 Ts 对真空和空气中激光诱导击穿光谱（LIBS）发射特性和免校准 LIBS（CF-LIBS）定量分析的影响。我们使用铝锡铜合金分析了 20 °C 至 170 °C 温度范围内的光谱线。评估包括发射线强度、等离子参数、膨胀图像和激光烧蚀坑形态。CF-LIBS 分析结果表明，即使对于线较弱的次要元素，升高的 Ts 也能保持定量的准确性。在大气条件下，锡会发生偏析，但 CF-LIBS 仍然保持稳定。这些结果凸显了 CF-LIBS 通过减轻 Ts 引起的影响而实现各种应用的潜力。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Analysis of an Al-Sn-Cu alloy by calibration-free laser-induced breakdown spectroscopy under varying sample temperature conditions

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Analysis of an Al-Sn-Cu alloy by calibration-free laser-induced breakdown spectroscopy under varying sample temperature conditions

This study investigates the impact of sample temperature T_s on Laser-Induced Breakdown Spectroscopy (LIBS) emission characteristics and Calibration-Free LIBS (CF-LIBS) quantitative analysis in vacuum and air. Using an aluminum‑tin‑copper alloy, we analyze spectral lines within a 20 °C to 170 °C temperature range. Evaluation encompasses emission line intensities, plasma parameters, expansion imagery, and laser ablation crater morphologies. CF-LIBS analysis underlines that elevated T_s maintains quantitative accuracy even for minor elements with weak lines. In atmospheric conditions, tin segregation occurs, yet CF-LIBS remains robust. These results highlight CF-LIBS's potential for varied applications by mitigating T_s-induced effects.

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来源期刊

Spectrochimica Acta Part B: Atomic Spectroscopy 物理-光谱学

CiteScore

6.10

自引率

12.10%

发文量

173

审稿时长

81 days

期刊介绍： Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.