基于二氧化钛/硅的先进太阳能电池结构分析:提高光伏参数和热稳定性

IF 4.6 Q2 MATERIALS SCIENCE, BIOMATERIALS
Dibyendu Kumar Ghosh, Shiladitya Acharyya, Sukanta Bose, Gourab Das, Sumita Mukhopadhyay, Anindita Sengupta
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引用次数: 0

摘要

本文使用 Automat FOR Simulation of HETero-structures v2.5 软件来揭示基于 110 μm 晶圆的 TiO2/c-Si 异质结太阳能电池结构的光伏性能和热稳定性。首先,通过改变发射极层(即二氧化钛层)的不同特性:厚度、载流子浓度和二氧化钛/硅界面上的缺陷密度,探讨了光伏性能与发射极层的关系。研究表明,即使晶片厚度保持在 110 μm,TiO2 发射层的厚度和掺杂浓度分别保持为 7 nm 和 1 × 1020 cm-3,功率转换效率仍可高达 16.34%(即使没有任何界面钝化层)。TiO2/p-Si 界面的相应缺陷密度为 1 × 1012 cm-2。此外,通过在器件结构的后侧嵌入氧化物上多晶硅或载流子选择性接触层,还实现了功率输出的显著增益。在金属/晶体硅界面后侧的氧化物结构上嵌入多晶硅时,详细探讨了超薄隧道氧化物厚度对器件性能的影响。接下来,氧化物上的多晶硅结构被器件结构后侧的高效空穴传输层氧化镍层所取代。在镍氧化物层的不同载流子浓度下,镍氧化物厚度、镍氧化物带隙和镍氧化物/硅界面上的缺陷密度等各种影响性能的参数都发生了变化,以获得实现最大功率输出的最佳条件。研究还进一步扩展,以考察晶片寿命对所有模拟太阳能电池器件性能的影响。最后,器件温度在 275 至 375 K 之间变化,间隔为 25 K,以研究拟议电池结构的热稳定性,从而在光伏性能和热稳定性方面为实际制造选择最佳结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Analysis of Advanced TiO2/Si based Solar Cell Architecture: Improving PV Parameters and Thermal Stability

In this contribution, Automat FOR Simulation of HETero-structures v2.5 software was used for unveiling the photovoltaic performance and thermal stability of relatively less explored TiO2/c-Si heterojunction solar cell architecture based on 110 μm wafers. Firstly, the dependence of the photovoltaic performance on the emitter layer, i.e. the TiO2 layer, was explored by varying its different characteristics: thickness, carrier concentration and the defect density at the TiO2/Si interface. The study revealed that the power conversion efficiency might be as high as 16.34% (even without any interfacial passivation layer) even when the thickness of the wafer was kept at 110 μm; the thickness and the doping concentration of the TiO2 emitter layer were kept as 7 nm and 1 × 1020 cm−3; respectively. The corresponding defect density at the TiO2/p-Si interface was 1 × 1012 cm−2. Furthermore, a significant gain in the power output was realized by embedding either poly-silicon on oxide or carrier selective contact layer at the rear side of the device architecture. In the case of the incorporation of poly-silicon on the oxide structure at the rear side of the metal/c-Si interface, the role of the ultra-thin tunnel oxide thickness on the device's performance was explored in detail. Next, the poly-silicon on oxide structure was replaced by the NiOx layer, an efficient hole transport layer at the rear side of the device architecture. Various performance-affecting parameters, such as NiOx thickness, NiOx band gap, and the defect density at the NiOx/Si interface, were varied at different carrier concentrations of the NiOx layer to obtain the best possible conditions for realizing the maximum power output. The study was further extended to examine the influence of the wafer lifetime on the device performance of all the simulated solar cells. Eventually, the device temperature was varied from 275 to 375 K with an interval of 25 K to investigate the thermal stability of the proposed cell architectures so that the best possible architecture could be selected for practical fabrication both in terms of photovoltaic performance and thermal stability.

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来源期刊
ACS Applied Bio Materials
ACS Applied Bio Materials Chemistry-Chemistry (all)
CiteScore
9.40
自引率
2.10%
发文量
464
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