基于硒化锑的电子开关器件过渡速度快,中隙态稳定,性能衰减最小

Electron Pub Date : 2024-06-15 DOI:10.1002/elt2.46
Xianliang Mai, Qundao Xu, Zhe Yang, Huan Wang, Yongpeng Liu, Yinghua Shen, Hengyi Hu, Meng Xu, Zhongrui Wang, Hao Tong, Chengliang Wang, Xiangshui Miao, Ming Xu
{"title":"基于硒化锑的电子开关器件过渡速度快,中隙态稳定,性能衰减最小","authors":"Xianliang Mai,&nbsp;Qundao Xu,&nbsp;Zhe Yang,&nbsp;Huan Wang,&nbsp;Yongpeng Liu,&nbsp;Yinghua Shen,&nbsp;Hengyi Hu,&nbsp;Meng Xu,&nbsp;Zhongrui Wang,&nbsp;Hao Tong,&nbsp;Chengliang Wang,&nbsp;Xiangshui Miao,&nbsp;Ming Xu","doi":"10.1002/elt2.46","DOIUrl":null,"url":null,"abstract":"<p>Chalcogenide glass has a unique volatile transition between high- and low-resistance states under an electric field, a phenomenon termed ovonic threshold switching (OTS). This characteristic is extensively utilized in various electronic memory and computational devices, particularly as selectors for cross-point memory architectures. Despite its advantages, the material is susceptible to glass relaxation, which can result in substantial drifts in threshold voltage and a decline in off-current performance over successive operational cycles or long storage time. In this study, we introduce an OTS device made from stoichiometric Sb<sub>2</sub>Se<sub>3</sub> glass, which retains an octahedral local structure within its amorphous matrix. This innovative material exhibits outstanding OTS capabilities, maintaining minimal degradation despite undergoing over 10<sup>7</sup> operating cycles. Via comprehensive first-principles calculations, our findings indicate that the mid-gap states in amorphous Sb<sub>2</sub>Se<sub>3</sub> predominantly stem from the atomic chains characterized by heteropolar Sb-Se bonds. These bonds exhibit remarkable stability, showing minimal alteration over time, thereby contributing to the overall durability and consistent performance of the material. Our findings not only shed light on the complex physical origins that govern the OTS behavior but also lay the groundwork for creating or optimizing innovative electrical switching materials.</p>","PeriodicalId":100403,"journal":{"name":"Electron","volume":"3 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/elt2.46","citationCount":"0","resultStr":"{\"title\":\"Sb-Se-based electrical switching device with fast transition speed and minimized performance degradation due to stable mid-gap states\",\"authors\":\"Xianliang Mai,&nbsp;Qundao Xu,&nbsp;Zhe Yang,&nbsp;Huan Wang,&nbsp;Yongpeng Liu,&nbsp;Yinghua Shen,&nbsp;Hengyi Hu,&nbsp;Meng Xu,&nbsp;Zhongrui Wang,&nbsp;Hao Tong,&nbsp;Chengliang Wang,&nbsp;Xiangshui Miao,&nbsp;Ming Xu\",\"doi\":\"10.1002/elt2.46\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Chalcogenide glass has a unique volatile transition between high- and low-resistance states under an electric field, a phenomenon termed ovonic threshold switching (OTS). This characteristic is extensively utilized in various electronic memory and computational devices, particularly as selectors for cross-point memory architectures. Despite its advantages, the material is susceptible to glass relaxation, which can result in substantial drifts in threshold voltage and a decline in off-current performance over successive operational cycles or long storage time. In this study, we introduce an OTS device made from stoichiometric Sb<sub>2</sub>Se<sub>3</sub> glass, which retains an octahedral local structure within its amorphous matrix. This innovative material exhibits outstanding OTS capabilities, maintaining minimal degradation despite undergoing over 10<sup>7</sup> operating cycles. Via comprehensive first-principles calculations, our findings indicate that the mid-gap states in amorphous Sb<sub>2</sub>Se<sub>3</sub> predominantly stem from the atomic chains characterized by heteropolar Sb-Se bonds. These bonds exhibit remarkable stability, showing minimal alteration over time, thereby contributing to the overall durability and consistent performance of the material. Our findings not only shed light on the complex physical origins that govern the OTS behavior but also lay the groundwork for creating or optimizing innovative electrical switching materials.</p>\",\"PeriodicalId\":100403,\"journal\":{\"name\":\"Electron\",\"volume\":\"3 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://onlinelibrary.wiley.com/doi/epdf/10.1002/elt2.46\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electron\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1002/elt2.46\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electron","FirstCategoryId":"1085","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/elt2.46","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

在电场作用下,钙化玻璃在高电阻态和低电阻态之间具有独特的挥发性转换,这种现象被称为椭圆阈值转换(OTS)。这一特性被广泛应用于各种电子存储器和计算设备中,特别是作为交叉点存储器架构的选择器。尽管这种材料具有诸多优点,但它容易受到玻璃弛豫的影响,从而导致阈值电压大幅漂移,并在连续运行周期或长时间存储过程中出现断流性能下降。在本研究中,我们介绍了一种由化学计量 Sb2Se3 玻璃制成的 OTS 器件,这种玻璃在其非晶基质中保留了八面体局部结构。这种创新材料表现出卓越的 OTS 能力,尽管经历了超过 107 个工作循环,但降解仍保持在最低水平。通过全面的第一性原理计算,我们的研究结果表明,非晶态 Sb2Se3 中的中隙态主要来自于以异极 Sb-Se 键为特征的原子链。这些键表现出卓越的稳定性,随着时间的推移变化极小,因此有助于材料的整体耐久性和一致性能。我们的发现不仅揭示了支配 OTS 行为的复杂物理根源,还为创建或优化创新型电气开关材料奠定了基础。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Sb-Se-based electrical switching device with fast transition speed and minimized performance degradation due to stable mid-gap states

Sb-Se-based electrical switching device with fast transition speed and minimized performance degradation due to stable mid-gap states

Chalcogenide glass has a unique volatile transition between high- and low-resistance states under an electric field, a phenomenon termed ovonic threshold switching (OTS). This characteristic is extensively utilized in various electronic memory and computational devices, particularly as selectors for cross-point memory architectures. Despite its advantages, the material is susceptible to glass relaxation, which can result in substantial drifts in threshold voltage and a decline in off-current performance over successive operational cycles or long storage time. In this study, we introduce an OTS device made from stoichiometric Sb2Se3 glass, which retains an octahedral local structure within its amorphous matrix. This innovative material exhibits outstanding OTS capabilities, maintaining minimal degradation despite undergoing over 107 operating cycles. Via comprehensive first-principles calculations, our findings indicate that the mid-gap states in amorphous Sb2Se3 predominantly stem from the atomic chains characterized by heteropolar Sb-Se bonds. These bonds exhibit remarkable stability, showing minimal alteration over time, thereby contributing to the overall durability and consistent performance of the material. Our findings not only shed light on the complex physical origins that govern the OTS behavior but also lay the groundwork for creating or optimizing innovative electrical switching materials.

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