研究不同隔离技术对蓝色微型 LED 阵列应用性能的影响。

0 MATERIALS SCIENCE, MULTIDISCIPLINARY
Shao-Hua Lin, Yu-Yun Lo, Yu-Hsuan Hsu, Chien-Chung Lin, Hsiao-Wen Zan, Yi-Hsin Lin, Dong-Sing Wuu, Ching-Lien Hsiao, Ray-Hua Horng
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引用次数: 0

摘要

本研究采用金属有机化学气相沉积技术,在蓝宝石衬底上生长的外延层上制作了像素尺寸为 10 × 10 μm2、间距为 15 μm 的 3 × 3 蓝色微型 LED 阵列。制造过程包括光刻、干湿蚀刻、电子束蒸发和离子注入技术。利用砷多能量植入技术取代了用于电气隔离的网格蚀刻技术,植入深度随平均能量的增加而增加。不同的离子深度剖面对正向电流和漏电流等电气特性有不同的影响,可能会对 n-GaN 层造成损坏,并增加 LED 的串联电阻。随着植入深度的增加,LED 的光输出功率和峰值外部量子效率也有所提高,从 5.33% 提高到 9.82%。然而,效率下降也从 46.3% 增加到 48.6%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Study on different isolation technology on the performance of blue micro-LEDs array applications.

Study on different isolation technology on the performance of blue micro-LEDs array applications.

In this study, a 3 × 3 blue micro-LED array with a pixel size of 10 × 10 μm2 and a pitch of 15 μm was fabricated on an epilayer grown on a sapphire substrate using metalorganic chemical vapor deposition technology. The fabrication process involved photolithography, wet and dry etching, E-beam evaporation, and ion implantation technology. Arsenic multi-energy implantation was utilized to replace the mesa etching for electrical isolation, where the implantation depth increased with the average energy. Different ion depth profiles had varying effects on electrical properties, such as forward current and leakage currents, potentially causing damage to the n-GaN layer and increasing the series resistance of the LEDs. As the implantation depth increased, the light output power and peak external quantum efficiency of the LEDs also increased, improving from 5.33 to 9.82%. However, the efficiency droop also increased from 46.3 to 48.6%.

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