采用混合逻辑方案的 SRAM 高性能、低功耗解码器电路

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Donghao Xia , Yuejun Zhang , Yuanxin Tian , Mengfan Xu , Liang Wen
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引用次数: 0

摘要

针对 SRAM 中的解码器,我们提出了一种混合逻辑设计方案,它将通过晶体管逻辑(PTL)和双值逻辑(DVL)与静态 CMOS 逻辑相结合。通过使用混合逻辑电路,为解码器提供了新的 n 晶体管 (T) NAND/AND 结构,与传统电路相比,晶体管数量更少,速度更快,功耗更低,并且具有全摆幅能力和良好的抗噪能力。使用台积电 28 纳米工艺对混合逻辑解码器进行了实验,结果表明与传统相应电路相比,混合逻辑解码器在传播延迟和功耗方面更具优势。混合逻辑 2-4 解码器的传播延迟减少了 36%,功耗降低了 10%;混合逻辑 3-8 解码器的传播延迟减少了 27%,功耗降低了 5.5%;混合逻辑 4-16 解码器的传播延迟减少了 30%,功耗降低了 5%;混合逻辑 5-32 解码器的传播延迟减少了 34%,功耗降低了 6.3%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High-perfoprmance and low-power decoder circuits for SRAMs using mixed-logic scheme

A mixed-logic design scheme utilizing pass-transistor logic (PTL) and dual-value logic (DVL) in combination with static CMOS logic for decoders in SRAMs is proposed. By using of the mixed-logic circuit, new n-Transistor (T) NAND/AND structures were provided for decoders, while achieving fewer transistors, faster speed, lower power dissipation as compared to traditional circuits, and having full-swing capability and good noise immunity. Experiments were conducted using TSMC 28 nm process for mixed-logic decoders, and the results show the superiority in terms of propagation delay and power dissipation, compared to the conventional corresponding circuits. A mixed-logic 2-4 decoder exhibits 36 % reduction in propagation delay and 10 % improvement in power dissipation; A mixed-logic 3-8 decoder exhibits 27 % reduction in propagation delay and 5.5 % improvement in power dissipation; While, A mixed-logic 4-16 decoder exhibits 30 % reduction in propagation delay and 5 % improvement in power dissipation; As well, A mixed-logic 5-32 decoder exhibits 34 % reduction in propagation delay and 6.3 % improvement in power dissipation.

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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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