{"title":"通过可解释的人工智能机制加强自我监督学习:计算分析","authors":"Elie Neghawi, Yan Liu","doi":"10.3390/bdcc8060058","DOIUrl":null,"url":null,"abstract":"Self-supervised learning continues to drive advancements in machine learning. However, the absence of unified computational processes for benchmarking and evaluation remains a challenge. This study conducts a comprehensive analysis of state-of-the-art self-supervised learning algorithms, emphasizing their underlying mechanisms and computational intricacies. Building upon this analysis, we introduce a unified model-agnostic computation (UMAC) process, tailored to complement modern self-supervised learning algorithms. UMAC serves as a model-agnostic and global explainable artificial intelligence (XAI) methodology that is capable of systematically integrating and enhancing state-of-the-art algorithms. Through UMAC, we identify key computational mechanisms and craft a unified framework for self-supervised learning evaluation. Leveraging UMAC, we integrate an XAI methodology to enhance transparency and interpretability. Our systematic approach yields a 17.12% increase in improvement in training time complexity and a 13.1% boost in improvement in testing time complexity. Notably, improvements are observed in augmentation, encoder architecture, and auxiliary components within the network classifier. These findings underscore the importance of structured computational processes in enhancing model efficiency and fortifying algorithmic transparency in self-supervised learning, paving the way for more interpretable and efficient AI models.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"58 32","pages":""},"PeriodicalIF":4.3000,"publicationDate":"2024-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Enhancing Self-Supervised Learning through Explainable Artificial Intelligence Mechanisms: A Computational Analysis\",\"authors\":\"Elie Neghawi, Yan Liu\",\"doi\":\"10.3390/bdcc8060058\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Self-supervised learning continues to drive advancements in machine learning. However, the absence of unified computational processes for benchmarking and evaluation remains a challenge. This study conducts a comprehensive analysis of state-of-the-art self-supervised learning algorithms, emphasizing their underlying mechanisms and computational intricacies. Building upon this analysis, we introduce a unified model-agnostic computation (UMAC) process, tailored to complement modern self-supervised learning algorithms. UMAC serves as a model-agnostic and global explainable artificial intelligence (XAI) methodology that is capable of systematically integrating and enhancing state-of-the-art algorithms. Through UMAC, we identify key computational mechanisms and craft a unified framework for self-supervised learning evaluation. Leveraging UMAC, we integrate an XAI methodology to enhance transparency and interpretability. Our systematic approach yields a 17.12% increase in improvement in training time complexity and a 13.1% boost in improvement in testing time complexity. Notably, improvements are observed in augmentation, encoder architecture, and auxiliary components within the network classifier. These findings underscore the importance of structured computational processes in enhancing model efficiency and fortifying algorithmic transparency in self-supervised learning, paving the way for more interpretable and efficient AI models.\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":\"58 32\",\"pages\":\"\"},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2024-06-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.3390/bdcc8060058\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3390/bdcc8060058","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Enhancing Self-Supervised Learning through Explainable Artificial Intelligence Mechanisms: A Computational Analysis
Self-supervised learning continues to drive advancements in machine learning. However, the absence of unified computational processes for benchmarking and evaluation remains a challenge. This study conducts a comprehensive analysis of state-of-the-art self-supervised learning algorithms, emphasizing their underlying mechanisms and computational intricacies. Building upon this analysis, we introduce a unified model-agnostic computation (UMAC) process, tailored to complement modern self-supervised learning algorithms. UMAC serves as a model-agnostic and global explainable artificial intelligence (XAI) methodology that is capable of systematically integrating and enhancing state-of-the-art algorithms. Through UMAC, we identify key computational mechanisms and craft a unified framework for self-supervised learning evaluation. Leveraging UMAC, we integrate an XAI methodology to enhance transparency and interpretability. Our systematic approach yields a 17.12% increase in improvement in training time complexity and a 13.1% boost in improvement in testing time complexity. Notably, improvements are observed in augmentation, encoder architecture, and auxiliary components within the network classifier. These findings underscore the importance of structured computational processes in enhancing model efficiency and fortifying algorithmic transparency in self-supervised learning, paving the way for more interpretable and efficient AI models.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
Portico