利用电荷状态比估算原子探针断层成像实验中的电场

IF 2.9 4区 工程技术 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Levi Tegg, Leigh T Stephenson, Julie M Cairney
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引用次数: 0

摘要

Kingham [(1982).场蒸发离子的后电离:多重电荷态的理论解释。Surf Sci 116(2), 273-301]提供了在原子探针断层扫描(APT)实验中观察到高电荷态的概率方程。这些 "Kingham 曲线 "在 APT 中有着广泛的应用,但无法通过分析转换来提供易于测量的电荷状态比 (CSR) 电场。在此,我们提供了一个数值方案,用于计算金厄姆曲线和电场随 CSR 的变化。我们发现,电场随 CSR 的变化可以用一个简单的两参数或三参数方程很好地描述,而且该模型对大多数元素和电荷状态都很精确。我们将该模型应用于纯铝和微合金钢的 APT 实验数据,证明本文所述方法可轻松应用于各种 APT 问题,以了解电场变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Estimation of the Electric Field in Atom Probe Tomography Experiments Using Charge State Ratios.

Kingham [(1982). The post-ionization of field evaporated ions: A theoretical explanation of multiple charge states. Surf Sci116(2), 273-301] provided equations for the probability of observing higher charge states in atom probe tomography (APT) experiments. These "Kingham curves" have wide application in APT, but cannot be analytically transformed to provide the electric field in terms of the easily measured charge state ratio (CSR). Here we provide a numerical scheme for the calculation of Kingham curves and the variation in electric field with CSR. We find the variation in electric field with CSR is well described by a simple two- or three-parameter equation, and the model is accurate to most elements and charge states. The model is applied to experimental APT data of pure aluminium and a microalloyed steel, demonstrating that the methods described in this work can be easily applied to a variety of APT problems to understand electric field variations.

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来源期刊
Microscopy and Microanalysis
Microscopy and Microanalysis 工程技术-材料科学:综合
CiteScore
1.10
自引率
10.70%
发文量
1391
审稿时长
6 months
期刊介绍: Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science. The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure. Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.
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