增材制造缺陷检测中的应用人工智能:当前文献、度量标准、数据集和公开挑战

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Y. Djenouri, Gautam Srivastava, Jerry Chun‐Wei Lin
{"title":"增材制造缺陷检测中的应用人工智能:当前文献、度量标准、数据集和公开挑战","authors":"Y. Djenouri, Gautam Srivastava, Jerry Chun‐Wei Lin","doi":"10.1109/MIM.2024.10540405","DOIUrl":null,"url":null,"abstract":"Defect detection in additive manufacturing refers to the evaluation of collected industrial images and the identification of parts that cause anomalies to optimize decision-making in an industrial production context. The advent of the Internet of Things and the widespread installation of electronic sensors, such as image sensors in industrial production lines, have expanded the processing capabilities of analytics tools. By extracting visual information via convolutional operations, deep learning-based algorithms have recently overcome drawbacks of traditional machine learning methods. This paper provides an analysis of contemporary defect detection techniques based on deep learning. Existing methods for defect detection algorithms in additive manufacturing are discussed. In terms of potential research to improve defect detection in additive manufacturing, the difficulties and emerging trends related to defect detection through deep learning are also outlined.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Applied AI in Defect Detection for Additive Manufacturing: Current Literature, Metrics, Datasets, and Open Challenges\",\"authors\":\"Y. Djenouri, Gautam Srivastava, Jerry Chun‐Wei Lin\",\"doi\":\"10.1109/MIM.2024.10540405\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Defect detection in additive manufacturing refers to the evaluation of collected industrial images and the identification of parts that cause anomalies to optimize decision-making in an industrial production context. The advent of the Internet of Things and the widespread installation of electronic sensors, such as image sensors in industrial production lines, have expanded the processing capabilities of analytics tools. By extracting visual information via convolutional operations, deep learning-based algorithms have recently overcome drawbacks of traditional machine learning methods. This paper provides an analysis of contemporary defect detection techniques based on deep learning. Existing methods for defect detection algorithms in additive manufacturing are discussed. In terms of potential research to improve defect detection in additive manufacturing, the difficulties and emerging trends related to defect detection through deep learning are also outlined.\",\"PeriodicalId\":55025,\"journal\":{\"name\":\"IEEE Instrumentation & Measurement Magazine\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2024-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Instrumentation & Measurement Magazine\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1109/MIM.2024.10540405\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Instrumentation & Measurement Magazine","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/MIM.2024.10540405","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

增材制造中的缺陷检测是指对收集的工业图像进行评估,并识别导致异常的部件,以优化工业生产背景下的决策。物联网的出现和电子传感器(如工业生产线上的图像传感器)的广泛安装,扩大了分析工具的处理能力。通过卷积运算提取视觉信息,基于深度学习的算法最近克服了传统机器学习方法的缺点。本文分析了基于深度学习的当代缺陷检测技术。本文讨论了增材制造中缺陷检测算法的现有方法。在改进增材制造缺陷检测的潜在研究方面,还概述了与通过深度学习进行缺陷检测有关的困难和新兴趋势。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Applied AI in Defect Detection for Additive Manufacturing: Current Literature, Metrics, Datasets, and Open Challenges
Defect detection in additive manufacturing refers to the evaluation of collected industrial images and the identification of parts that cause anomalies to optimize decision-making in an industrial production context. The advent of the Internet of Things and the widespread installation of electronic sensors, such as image sensors in industrial production lines, have expanded the processing capabilities of analytics tools. By extracting visual information via convolutional operations, deep learning-based algorithms have recently overcome drawbacks of traditional machine learning methods. This paper provides an analysis of contemporary defect detection techniques based on deep learning. Existing methods for defect detection algorithms in additive manufacturing are discussed. In terms of potential research to improve defect detection in additive manufacturing, the difficulties and emerging trends related to defect detection through deep learning are also outlined.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
IEEE Instrumentation & Measurement Magazine
IEEE Instrumentation & Measurement Magazine 工程技术-工程:电子与电气
CiteScore
4.20
自引率
4.80%
发文量
147
审稿时长
>12 weeks
期刊介绍: IEEE Instrumentation & Measurement Magazine is a bimonthly publication. It publishes in February, April, June, August, October, and December of each year. The magazine covers a wide variety of topics in instrumentation, measurement, and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in instrumentation and measurement.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信