基于图划分和概率二项式方法的组合电路故障率分析

Esther Goudet, Fabio Sureau, Paul Breuil, Luis Peña Treviño, Lirida Naviner, Jean-Marc Daveau, Philippe Roche
{"title":"基于图划分和概率二项式方法的组合电路故障率分析","authors":"Esther Goudet, Fabio Sureau, Paul Breuil, Luis Peña Treviño, Lirida Naviner, Jean-Marc Daveau, Philippe Roche","doi":"10.1007/s10836-024-06119-5","DOIUrl":null,"url":null,"abstract":"<p>This paper studies the fault propagation and the correctness rate calculation of combinatorial circuits. We rely on circuit partitioning and on a probabilistic approach close to a binomial distribution, assuming some simultaneous faults have a certain probability to occur in the circuit’s gates. We extend the results of our <i>Clusterized Probabilistic Binomial Reliability</i> model (CPBR), in which we obtained the results for several combinatorial multiplier designs, as seen in our previous publication. We now target non-arithmetic combinatorial netlists and, among them, a few circuits with flip-flop instances. We use the graph representation of the combinatorial netlists and we generalize our approach with a generic algorithm for CPBR. To develop this algorithm, we use some existing work on multilevel acyclic hypergraph partitioning, that we adapt to acyclic directed graphs. Furthermore, we address the problem of calculating correctness rates of circuits in cases where sequential flip-flops induce cycles in the graph. Our experiments show that our approach is capable of analysing the error and the correctness rates of significant non-arithmetic circuits, with an automatized and generic tool.</p>","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"38 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach\",\"authors\":\"Esther Goudet, Fabio Sureau, Paul Breuil, Luis Peña Treviño, Lirida Naviner, Jean-Marc Daveau, Philippe Roche\",\"doi\":\"10.1007/s10836-024-06119-5\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>This paper studies the fault propagation and the correctness rate calculation of combinatorial circuits. We rely on circuit partitioning and on a probabilistic approach close to a binomial distribution, assuming some simultaneous faults have a certain probability to occur in the circuit’s gates. We extend the results of our <i>Clusterized Probabilistic Binomial Reliability</i> model (CPBR), in which we obtained the results for several combinatorial multiplier designs, as seen in our previous publication. We now target non-arithmetic combinatorial netlists and, among them, a few circuits with flip-flop instances. We use the graph representation of the combinatorial netlists and we generalize our approach with a generic algorithm for CPBR. To develop this algorithm, we use some existing work on multilevel acyclic hypergraph partitioning, that we adapt to acyclic directed graphs. Furthermore, we address the problem of calculating correctness rates of circuits in cases where sequential flip-flops induce cycles in the graph. Our experiments show that our approach is capable of analysing the error and the correctness rates of significant non-arithmetic circuits, with an automatized and generic tool.</p>\",\"PeriodicalId\":501485,\"journal\":{\"name\":\"Journal of Electronic Testing\",\"volume\":\"38 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Electronic Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/s10836-024-06119-5\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronic Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s10836-024-06119-5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文研究组合电路的故障传播和正确率计算。我们依靠电路分区和接近二项分布的概率方法,假设一些同时发生的故障有一定概率发生在电路的门电路中。我们扩展了簇化概率二叉可靠性模型(CPBR)的结果,在 CPBR 模型中,我们获得了几种组合乘法器设计的结果,这在我们之前的出版物中已有介绍。现在,我们的目标是非算术组合网表,其中包括一些带有触发器实例的电路。我们使用组合网表的图表示法,并用 CPBR 的通用算法来推广我们的方法。为了开发这种算法,我们使用了一些现有的多级非循环超图分割方法,并将其应用于非循环有向图。此外,我们还解决了在连续触发器引起图中循环的情况下计算电路正确率的问题。我们的实验表明,我们的方法能够分析重要的非算术电路的错误率和正确率,而且是一种自动化的通用工具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach

Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach

This paper studies the fault propagation and the correctness rate calculation of combinatorial circuits. We rely on circuit partitioning and on a probabilistic approach close to a binomial distribution, assuming some simultaneous faults have a certain probability to occur in the circuit’s gates. We extend the results of our Clusterized Probabilistic Binomial Reliability model (CPBR), in which we obtained the results for several combinatorial multiplier designs, as seen in our previous publication. We now target non-arithmetic combinatorial netlists and, among them, a few circuits with flip-flop instances. We use the graph representation of the combinatorial netlists and we generalize our approach with a generic algorithm for CPBR. To develop this algorithm, we use some existing work on multilevel acyclic hypergraph partitioning, that we adapt to acyclic directed graphs. Furthermore, we address the problem of calculating correctness rates of circuits in cases where sequential flip-flops induce cycles in the graph. Our experiments show that our approach is capable of analysing the error and the correctness rates of significant non-arithmetic circuits, with an automatized and generic tool.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信