{"title":"AiTO:利用 GNN 和 RL 同时优化栅极尺寸和缓冲器插入以实现时序优化","authors":"Hongxi Wu , Zhipeng Huang , Xingquan Li , Wenxing Zhu","doi":"10.1016/j.vlsi.2024.102211","DOIUrl":null,"url":null,"abstract":"<div><p>Gate sizing and buffer insertion for timing optimization are performed extensively in electronic design automation (EDA) flows. Both of them aim to adjust the upstream and downstream capacitances of gates/buffers to minimize delay. However, most of existing work focuses on gate sizing or buffer insertion independently. This paper proposes a learning-based timing optimization framework, AiTO, that combines reinforcement learning with graph neural network, to perform simultaneously gate sizing and buffer insertion. We model buffer insertion as a special gate sizing by determining possible buffer locations in advance and treating the buffer insertion and gate sizing as an RL process. Experimental results on 10 real designs (28-nm and 110-nm) show that, AiTO can achieve better worst negative slack (WNS) optimization results than OpenROAD while being able to improve the results of the commercial tool, Innovus, to some extent. Moreover, ablation studies demonstrate the benefits of performing simultaneous gate sizing and buffer insertion for timing optimization.</p></div>","PeriodicalId":54973,"journal":{"name":"Integration-The Vlsi Journal","volume":null,"pages":null},"PeriodicalIF":2.2000,"publicationDate":"2024-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"AiTO: Simultaneous gate sizing and buffer insertion for timing optimization with GNNs and RL\",\"authors\":\"Hongxi Wu , Zhipeng Huang , Xingquan Li , Wenxing Zhu\",\"doi\":\"10.1016/j.vlsi.2024.102211\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Gate sizing and buffer insertion for timing optimization are performed extensively in electronic design automation (EDA) flows. Both of them aim to adjust the upstream and downstream capacitances of gates/buffers to minimize delay. However, most of existing work focuses on gate sizing or buffer insertion independently. This paper proposes a learning-based timing optimization framework, AiTO, that combines reinforcement learning with graph neural network, to perform simultaneously gate sizing and buffer insertion. We model buffer insertion as a special gate sizing by determining possible buffer locations in advance and treating the buffer insertion and gate sizing as an RL process. Experimental results on 10 real designs (28-nm and 110-nm) show that, AiTO can achieve better worst negative slack (WNS) optimization results than OpenROAD while being able to improve the results of the commercial tool, Innovus, to some extent. Moreover, ablation studies demonstrate the benefits of performing simultaneous gate sizing and buffer insertion for timing optimization.</p></div>\",\"PeriodicalId\":54973,\"journal\":{\"name\":\"Integration-The Vlsi Journal\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2024-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Integration-The Vlsi Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0167926024000750\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Integration-The Vlsi Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167926024000750","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
AiTO: Simultaneous gate sizing and buffer insertion for timing optimization with GNNs and RL
Gate sizing and buffer insertion for timing optimization are performed extensively in electronic design automation (EDA) flows. Both of them aim to adjust the upstream and downstream capacitances of gates/buffers to minimize delay. However, most of existing work focuses on gate sizing or buffer insertion independently. This paper proposes a learning-based timing optimization framework, AiTO, that combines reinforcement learning with graph neural network, to perform simultaneously gate sizing and buffer insertion. We model buffer insertion as a special gate sizing by determining possible buffer locations in advance and treating the buffer insertion and gate sizing as an RL process. Experimental results on 10 real designs (28-nm and 110-nm) show that, AiTO can achieve better worst negative slack (WNS) optimization results than OpenROAD while being able to improve the results of the commercial tool, Innovus, to some extent. Moreover, ablation studies demonstrate the benefits of performing simultaneous gate sizing and buffer insertion for timing optimization.
期刊介绍:
Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.