S. Grigoriev, Oleg V. Zakharov, V. G. Lysenko, D. A. Masterenko
{"title":"高效的全域形态过滤算法","authors":"S. Grigoriev, Oleg V. Zakharov, V. G. Lysenko, D. A. Masterenko","doi":"10.1007/s11018-024-02306-0","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":18352,"journal":{"name":"Measurement Techniques","volume":null,"pages":null},"PeriodicalIF":0.5000,"publicationDate":"2024-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An efficient algorithm for areal morphological filtering\",\"authors\":\"S. Grigoriev, Oleg V. Zakharov, V. G. Lysenko, D. A. Masterenko\",\"doi\":\"10.1007/s11018-024-02306-0\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":18352,\"journal\":{\"name\":\"Measurement Techniques\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.5000,\"publicationDate\":\"2024-05-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Measurement Techniques\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/s11018-024-02306-0\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"INSTRUMENTS & INSTRUMENTATION\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Measurement Techniques","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s11018-024-02306-0","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
期刊介绍:
Measurement Techniques contains articles of interest to all who are engaged in the study and application of fundamental measurements.
Topics covered include:
General problems of metrology;
Uniformity of measurement results;
Measurement standards of the units of physical quantities;
Measurement methods;
New measurement techniques in all fields of measurement (linear, mechanical, electromagnetic, optical, time and frequency, thermo-technical, ionising radiations etc.).