用最少的微取样进行深度分辨历史绘画研究,并以新发现的波提切利工作室绘画为例进行说明

IF 1.5 4区 物理与天体物理 Q3 SPECTROSCOPY
José Tapia, M. Eveno, É. Laval, I. Reiche
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引用次数: 0

摘要

在最近发现波提切利工作室的一幅画作后,我们采用一种创新的非侵入式方法对其进行了研究,该方法结合了二维扫描宏观 X 射线荧光成像(MA-XRF)和基于实验室的深度分辨定点选择共聚焦微 X 射线荧光(CXRF)装置。利用扫描电子显微镜和能量色散 X 射线系统对艺术品的横截面进行了测量,为这些分析提供了支持。这项研究的目的是确认画作的归属和鉴定,找到特征标记和特征,了解艺术家的技法、使用的材料和调色板,同时减少取样。所采用的分析方法结合了成像和定点选择技术,同时在不影响结果的前提下避免、减少和替代取样。通过 MA-XRF 获得了画作的化学图谱,从而确定了感兴趣的区域、颜色和化学元素,并对所使用的颜料进行了初步推测。然后,使用 CXRF 对精确区域和颜色进行了深度剖面分析,从而确定了重叠的颜料层,并获得了一幅更完整的三维绘画作品。将使用这一新方法得出的结果与传统使用的微取样分析过程进行对比,使我们能够确定结论的准确性和真实性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Depth‐resolved historical painting study with minimal microsampling, illustrated with a newly discovered Botticelli workshop painting
A painting from the Botticelli workshop has been studied after its recent discovery, with an innovative and noninvasive approach combining two‐ dimensional scanning macro‐x‐ray fluorescence imaging (MA‐XRF) and a laboratory‐based depth‐resolved site‐selective confocal micro‐x‐ray fluorescence (CXRF) device. These analyses were supported by measurements on cross‐sections taken from the artwork using scanning electron microscopy coupled with an energy‐dispersive x‐ray system. The aims of this study are to confirm the painting's attribution and authentication, find characteristic markers and features, understand the artist's technique, materials used, and palette, and all of it while reducing sampling. The analyzing approach used combines imaging and site‐selective techniques while avoiding, reducing and replacing sampling without compromising the results. Chemical maps of the painting were obtained by MA‐XRF and enabled the identification of zones, colors, and chemical elements of interest alongside with a first assumption on the pigments used. Depth profiles were then performed in precise areas and colors using CXRF, allowing to evidence overlaying paint layers and obtain a more complete 3D vision of the painting. Contrasting the findings using this new methodology with the traditionally employed analysis process involving microsampling allowed us to determine the accuracy and veracity of our conclusions.
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来源期刊
X-Ray Spectrometry
X-Ray Spectrometry 物理-光谱学
CiteScore
3.10
自引率
8.30%
发文量
38
审稿时长
6-12 weeks
期刊介绍: X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources. Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods. Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs. Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.
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