设计可合成的周期抖动传感器 IP,降低功耗并提高抗变化能力

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Jinn-Shyan Wang , Yu-Hsuan Kuo
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引用次数: 0

摘要

之前的研究提出了一种可合成的设计方法,以简化高分辨率片上周期抖动传感器(PJS)的设计。虽然大规模集成(VLSI)芯片的设计者希望将这种设计作为知识产权(IP),但我们的分析表明,这种 PJS 面临着关键挑战:高功耗以及易受静态 PVT 和动态 IR 滴变化的影响。这项工作开发了几种设计技术,以同时应对这些挑战。以用于监控 LPDDR4-4266 中时钟信号的 PJS IP 为设计实例,我们实现了分辨率为 1.0 ps 的 22 nm 2.133 GHz PJS,以验证设计技术。布局后仿真结果表明,新设计在满足分辨率规范的同时降低了一半以上的功耗。与之前的设计相比,新设计在更大的工艺变化范围内通过了功能和电气验证,而更高的变化弹性有助于可综合 Verilog 代码成为软 IP。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design of synthesizable period-jitter sensor IP with high power reduction and variation resiliency

Previous work has presented a synthesizable design approach to ease the design of an on-chip period-jitter sensor (PJS) with a high resolution. Although the designer of a very large scale integration (VLSI) chip hopes to use this design as an intellectual property (IP), our analysis reveals that this PJS faces key challenges: high power consumption and vulnerability to static PVT and dynamic IR-drop variations. This work develops several design techniques to conquer these challenges at the same time. Taking the PJS IP for monitoring the clock signal in LPDDR4-4266 as a design example, we implement a synthesized 22 nm 2.133 GHz PJS with a resolution of 1.0 ps to verify the design techniques. Post-layout simulation results show that the new design reduces over half of the power while meeting the resolution specification. It passes functional and electrical verification over a broader process variation than the previous design, and the higher variation resiliency assists the synthesizable Verilog code as a soft IP.

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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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