{"title":"利用统计参数确定多层涂层的分散特性","authors":"Elham Jasim Mohammad","doi":"10.3103/s8756699024700201","DOIUrl":null,"url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>Many studies about the multilayer coating have indicated the effects of reflection phase, reflection group delay (GD), and reflection group delay dispersion (GDD) characteristics. Some overlook the importance of studying complex statistical coefficients and their role in comparing the results of optical designs and realize how important information is in analyzing data. In statistics, one can learn various techniques for working with data. This paper goes into a detailed study of multilayer stacks’ dispersive properties for two mirror designs depending on MATLAB programs based on statistical parameters to evaluate the reflectance for the ZnS/MgF<span>\\({}_{2}\\)</span> mirror. Two samples with a quarter wavelength optical thickness were prepared, specially designed for 632.8 nm He-Ne laser mirrors. For the designed mirror, the value of the reflectivity of the thirteen-layer ZnS/MgF<span>\\({}_{2}\\)</span> mirror is 99.34<span>\\(\\%\\)</span>, while for the seven-layer ZnS/MgF<span>\\({}_{2}\\)</span> mirror is 96.57<span>\\(\\%\\)</span>. This study presents greater detail on statistics and realized data topics when designing multilayer coating, including mean, median, mode, and standard deviation (STD). The reliability and accuracy of the data can be verified by calculating the standard deviation.</p>","PeriodicalId":44919,"journal":{"name":"Optoelectronics Instrumentation and Data Processing","volume":"19 1","pages":""},"PeriodicalIF":0.5000,"publicationDate":"2024-05-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Determine Multilayers Coating Dispersive Properties Using Statistical Parameters\",\"authors\":\"Elham Jasim Mohammad\",\"doi\":\"10.3103/s8756699024700201\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<h3 data-test=\\\"abstract-sub-heading\\\">Abstract</h3><p>Many studies about the multilayer coating have indicated the effects of reflection phase, reflection group delay (GD), and reflection group delay dispersion (GDD) characteristics. Some overlook the importance of studying complex statistical coefficients and their role in comparing the results of optical designs and realize how important information is in analyzing data. In statistics, one can learn various techniques for working with data. This paper goes into a detailed study of multilayer stacks’ dispersive properties for two mirror designs depending on MATLAB programs based on statistical parameters to evaluate the reflectance for the ZnS/MgF<span>\\\\({}_{2}\\\\)</span> mirror. Two samples with a quarter wavelength optical thickness were prepared, specially designed for 632.8 nm He-Ne laser mirrors. For the designed mirror, the value of the reflectivity of the thirteen-layer ZnS/MgF<span>\\\\({}_{2}\\\\)</span> mirror is 99.34<span>\\\\(\\\\%\\\\)</span>, while for the seven-layer ZnS/MgF<span>\\\\({}_{2}\\\\)</span> mirror is 96.57<span>\\\\(\\\\%\\\\)</span>. This study presents greater detail on statistics and realized data topics when designing multilayer coating, including mean, median, mode, and standard deviation (STD). The reliability and accuracy of the data can be verified by calculating the standard deviation.</p>\",\"PeriodicalId\":44919,\"journal\":{\"name\":\"Optoelectronics Instrumentation and Data Processing\",\"volume\":\"19 1\",\"pages\":\"\"},\"PeriodicalIF\":0.5000,\"publicationDate\":\"2024-05-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optoelectronics Instrumentation and Data Processing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.3103/s8756699024700201\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"PHYSICS, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optoelectronics Instrumentation and Data Processing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3103/s8756699024700201","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, MULTIDISCIPLINARY","Score":null,"Total":0}
Determine Multilayers Coating Dispersive Properties Using Statistical Parameters
Abstract
Many studies about the multilayer coating have indicated the effects of reflection phase, reflection group delay (GD), and reflection group delay dispersion (GDD) characteristics. Some overlook the importance of studying complex statistical coefficients and their role in comparing the results of optical designs and realize how important information is in analyzing data. In statistics, one can learn various techniques for working with data. This paper goes into a detailed study of multilayer stacks’ dispersive properties for two mirror designs depending on MATLAB programs based on statistical parameters to evaluate the reflectance for the ZnS/MgF\({}_{2}\) mirror. Two samples with a quarter wavelength optical thickness were prepared, specially designed for 632.8 nm He-Ne laser mirrors. For the designed mirror, the value of the reflectivity of the thirteen-layer ZnS/MgF\({}_{2}\) mirror is 99.34\(\%\), while for the seven-layer ZnS/MgF\({}_{2}\) mirror is 96.57\(\%\). This study presents greater detail on statistics and realized data topics when designing multilayer coating, including mean, median, mode, and standard deviation (STD). The reliability and accuracy of the data can be verified by calculating the standard deviation.
期刊介绍:
The scope of Optoelectronics, Instrumentation and Data Processing encompasses, but is not restricted to, the following areas: analysis and synthesis of signals and images; artificial intelligence methods; automated measurement systems; physicotechnical foundations of micro- and optoelectronics; optical information technologies; systems and components; modelling in physicotechnical research; laser physics applications; computer networks and data transmission systems. The journal publishes original papers, reviews, and short communications in order to provide the widest possible coverage of latest research and development in its chosen field.