离子辅助沉积到玻璃上的各种条件下纳米厚铝铁合金薄膜上亚微米锥形表面形态的发展

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
I. I. Tashlykova-Bushkevich
{"title":"离子辅助沉积到玻璃上的各种条件下纳米厚铝铁合金薄膜上亚微米锥形表面形态的发展","authors":"I. I. Tashlykova-Bushkevich","doi":"10.1134/S1027451024020198","DOIUrl":null,"url":null,"abstract":"<p>The morphology, topography, and wettability with distilled water of Al–1.5 at % Fe alloy films with thicknesses of 25–90 nm are investigated. These films are formed on glass by ion-assisted deposition using a resonance ion source of vacuum arc plasma. Scanning probe microscopy reveals that the longitudinal and transverse roughness parameters, as well as dimensionless complexes, vary depending on the deposition mode and time. Measurement of these dimensionless parameters yields a quantitative description of cone formation processes in the Al–Fe/glass system. The mean roughness of the films increases in the range of 20–40 nm within the duration of deposition. Under self-irradiation conditions, the transition from island growth of the films to layered growth is observed. The effect of the substrate relief on the longitudinal step parameters of the film topography is found. Scanning electron microscopy is employed to examine the size and surface density of microdroplet-fraction particles. The size-frequency distributions of the microdroplet fraction are satisfactorily approximated by a lognormal distribution. Under self-ion irradiation conditions, 60–70% of particles comprising the microdroplet fraction are up to 0.8 µm in size. For the first time, a double Gaussian function is employed to approximate histograms of the distribution of relief features in the films, improving the accuracy in the description compared to a normal distribution law. The effectiveness of this approach in analyzing the structural formation of nanoscale films at various growth stages is demonstrated. By employing a bi-Gaussian model of the surface, the role of topographic characteristics in controlling the wetting of modified coatings is determined. The mechanism of the heterogeneous wetting of hydrophilic films in the Cassie state with contact edge angles of 50°–80° is discussed. In the potential mode, with an increase in deposition duration up to 10 h, the relief distribution of the films approximates a normal distribution, and the development of a submicrometer conical morphology on the surface leads to mixed wetting.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 2","pages":"333 - 347"},"PeriodicalIF":0.5000,"publicationDate":"2024-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Development of Submicrometer Conical Surface Morphology on Nanometer-Thick Al–Fe Alloy Films under Various Conditions of Ion-Assisted Deposition onto Glass\",\"authors\":\"I. I. Tashlykova-Bushkevich\",\"doi\":\"10.1134/S1027451024020198\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>The morphology, topography, and wettability with distilled water of Al–1.5 at % Fe alloy films with thicknesses of 25–90 nm are investigated. These films are formed on glass by ion-assisted deposition using a resonance ion source of vacuum arc plasma. Scanning probe microscopy reveals that the longitudinal and transverse roughness parameters, as well as dimensionless complexes, vary depending on the deposition mode and time. Measurement of these dimensionless parameters yields a quantitative description of cone formation processes in the Al–Fe/glass system. The mean roughness of the films increases in the range of 20–40 nm within the duration of deposition. Under self-irradiation conditions, the transition from island growth of the films to layered growth is observed. The effect of the substrate relief on the longitudinal step parameters of the film topography is found. Scanning electron microscopy is employed to examine the size and surface density of microdroplet-fraction particles. The size-frequency distributions of the microdroplet fraction are satisfactorily approximated by a lognormal distribution. Under self-ion irradiation conditions, 60–70% of particles comprising the microdroplet fraction are up to 0.8 µm in size. For the first time, a double Gaussian function is employed to approximate histograms of the distribution of relief features in the films, improving the accuracy in the description compared to a normal distribution law. The effectiveness of this approach in analyzing the structural formation of nanoscale films at various growth stages is demonstrated. By employing a bi-Gaussian model of the surface, the role of topographic characteristics in controlling the wetting of modified coatings is determined. The mechanism of the heterogeneous wetting of hydrophilic films in the Cassie state with contact edge angles of 50°–80° is discussed. In the potential mode, with an increase in deposition duration up to 10 h, the relief distribution of the films approximates a normal distribution, and the development of a submicrometer conical morphology on the surface leads to mixed wetting.</p>\",\"PeriodicalId\":671,\"journal\":{\"name\":\"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques\",\"volume\":\"18 2\",\"pages\":\"333 - 347\"},\"PeriodicalIF\":0.5000,\"publicationDate\":\"2024-05-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://link.springer.com/article/10.1134/S1027451024020198\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"PHYSICS, CONDENSED MATTER\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451024020198","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0

摘要

摘要 研究了厚度为 25-90 nm 的 Al-1.5% Fe 合金薄膜的形态、形貌以及与蒸馏水的润湿性。这些薄膜是通过真空电弧等离子体共振离子源在玻璃上进行离子辅助沉积形成的。扫描探针显微镜显示,纵向和横向粗糙度参数以及无量纲复数随沉积模式和时间的不同而变化。通过测量这些无量纲参数,可以定量描述铝-铁/玻璃体系中锥体的形成过程。在沉积过程中,薄膜的平均粗糙度在 20-40 纳米的范围内增加。在自辐照条件下,可以观察到薄膜从岛状生长过渡到层状生长。研究发现了基底凹凸对薄膜形貌纵向阶跃参数的影响。扫描电子显微镜用于研究微滴组分颗粒的尺寸和表面密度。用对数正态分布对微滴部分的尺寸-频率分布进行了令人满意的近似。在自离子辐照条件下,构成微液滴部分的 60-70% 的颗粒大小不超过 0.8 µm。与正态分布规律相比,该方法首次采用了双高斯函数来逼近薄膜中浮雕特征分布的直方图,从而提高了描述的准确性。这种方法在分析不同生长阶段的纳米级薄膜结构形成方面的有效性得到了证明。通过采用表面双高斯模型,确定了地形特征在控制改性涂层润湿中的作用。讨论了接触边缘角为 50°-80° 的卡西态亲水薄膜的异质润湿机理。在电位模式下,随着沉积时间延长至 10 小时,薄膜的浮雕分布接近于正态分布,表面亚微米锥形形貌的形成导致了混合润湿。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Development of Submicrometer Conical Surface Morphology on Nanometer-Thick Al–Fe Alloy Films under Various Conditions of Ion-Assisted Deposition onto Glass

Development of Submicrometer Conical Surface Morphology on Nanometer-Thick Al–Fe Alloy Films under Various Conditions of Ion-Assisted Deposition onto Glass

Development of Submicrometer Conical Surface Morphology on Nanometer-Thick Al–Fe Alloy Films under Various Conditions of Ion-Assisted Deposition onto Glass

The morphology, topography, and wettability with distilled water of Al–1.5 at % Fe alloy films with thicknesses of 25–90 nm are investigated. These films are formed on glass by ion-assisted deposition using a resonance ion source of vacuum arc plasma. Scanning probe microscopy reveals that the longitudinal and transverse roughness parameters, as well as dimensionless complexes, vary depending on the deposition mode and time. Measurement of these dimensionless parameters yields a quantitative description of cone formation processes in the Al–Fe/glass system. The mean roughness of the films increases in the range of 20–40 nm within the duration of deposition. Under self-irradiation conditions, the transition from island growth of the films to layered growth is observed. The effect of the substrate relief on the longitudinal step parameters of the film topography is found. Scanning electron microscopy is employed to examine the size and surface density of microdroplet-fraction particles. The size-frequency distributions of the microdroplet fraction are satisfactorily approximated by a lognormal distribution. Under self-ion irradiation conditions, 60–70% of particles comprising the microdroplet fraction are up to 0.8 µm in size. For the first time, a double Gaussian function is employed to approximate histograms of the distribution of relief features in the films, improving the accuracy in the description compared to a normal distribution law. The effectiveness of this approach in analyzing the structural formation of nanoscale films at various growth stages is demonstrated. By employing a bi-Gaussian model of the surface, the role of topographic characteristics in controlling the wetting of modified coatings is determined. The mechanism of the heterogeneous wetting of hydrophilic films in the Cassie state with contact edge angles of 50°–80° is discussed. In the potential mode, with an increase in deposition duration up to 10 h, the relief distribution of the films approximates a normal distribution, and the development of a submicrometer conical morphology on the surface leads to mixed wetting.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信