{"title":"用于 MC-ICP-MS 测定高浓度硅中同位素比值的 1011 和 1013 欧姆电阻器的比较及其影响","authors":"Axel Pramann and Olaf Rienitz","doi":"10.1039/D4JA00066H","DOIUrl":null,"url":null,"abstract":"<p >The molar mass <em>M</em> and isotopic composition of a silicon material highly enriched in <small><sup>28</sup></small>Si were measured for the first time using high ohmic (10<small><sup>13</sup></small> Ω) resistors in the feedback loop of amplifiers connected to the Faraday detectors of a multicollector-inductively coupled plasma mass spectrometer (MC-ICP-MS). In the context of the realization and dissemination of the SI units kilogram and mole <em>via</em> the X-ray crystal density (XRCD) method, it is of high importance to maintain and improve the state-of-the art technique to determine <em>M</em> with the lowest possible associated uncertainty. The applications and influences of 10<small><sup>11</sup></small> Ω and 10<small><sup>13</sup></small> Ω resistors for ion detection were compared using the crystal Si28-33Pr11 exhibiting a large range (≈10<small><sup>2</sup></small>) of the ratio <small><sup>30</sup></small>Si/<small><sup>29</sup></small>Si. The low abundance of <small><sup>30</sup></small>Si hampers the measurement and thus enlarges the uncertainty. The use of 10<small><sup>13</sup></small> Ω resistors enables a fourfold dilution of the initial Si sample stock solutions from <em>w</em><small><sub>x</sub></small>(Si) = 4536 μg g<small><sup>−1</sup></small> down to 1134 μg g<small><sup>−1</sup></small> preserving the MS equipment (ion lenses, slits <em>etc.</em>). A lower limit of <em>w</em><small><sub>x</sub></small>(Si) ≈ 1134 μg g<small><sup>−1</sup></small> for ion currents <em>I</em> = 3.4 fA (corresponding to <em>U</em> = 0.34 mV: gain corrected for <em>R</em> = 10<small><sup>13</sup></small> Ω) for <small><sup>30</sup></small>Si<small><sup>+</sup></small> was determined still maintaining the ability to yield <em>u</em><small><sub>rel</sub></small>(<em>M</em>) = 4 × 10<small><sup>−9</sup></small>. This will also enable the use of smaller sample sizes, which will considerably reduce costs and time and thus improve this method strongly. Tau correction for 10<small><sup>13</sup></small> Ω resistors was studied showing no significant influence in case of the continuous beam experiments.</p>","PeriodicalId":81,"journal":{"name":"Journal of Analytical Atomic Spectrometry","volume":" 6","pages":" 1540-1550"},"PeriodicalIF":3.1000,"publicationDate":"2024-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://pubs.rsc.org/en/content/articlepdf/2024/ja/d4ja00066h?page=search","citationCount":"0","resultStr":"{\"title\":\"Comparison and influence of 1011 and 1013 ohm resistors used for MC-ICP-MS determination of isotope ratios in highly enriched silicon†\",\"authors\":\"Axel Pramann and Olaf Rienitz\",\"doi\":\"10.1039/D4JA00066H\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p >The molar mass <em>M</em> and isotopic composition of a silicon material highly enriched in <small><sup>28</sup></small>Si were measured for the first time using high ohmic (10<small><sup>13</sup></small> Ω) resistors in the feedback loop of amplifiers connected to the Faraday detectors of a multicollector-inductively coupled plasma mass spectrometer (MC-ICP-MS). In the context of the realization and dissemination of the SI units kilogram and mole <em>via</em> the X-ray crystal density (XRCD) method, it is of high importance to maintain and improve the state-of-the art technique to determine <em>M</em> with the lowest possible associated uncertainty. The applications and influences of 10<small><sup>11</sup></small> Ω and 10<small><sup>13</sup></small> Ω resistors for ion detection were compared using the crystal Si28-33Pr11 exhibiting a large range (≈10<small><sup>2</sup></small>) of the ratio <small><sup>30</sup></small>Si/<small><sup>29</sup></small>Si. The low abundance of <small><sup>30</sup></small>Si hampers the measurement and thus enlarges the uncertainty. The use of 10<small><sup>13</sup></small> Ω resistors enables a fourfold dilution of the initial Si sample stock solutions from <em>w</em><small><sub>x</sub></small>(Si) = 4536 μg g<small><sup>−1</sup></small> down to 1134 μg g<small><sup>−1</sup></small> preserving the MS equipment (ion lenses, slits <em>etc.</em>). A lower limit of <em>w</em><small><sub>x</sub></small>(Si) ≈ 1134 μg g<small><sup>−1</sup></small> for ion currents <em>I</em> = 3.4 fA (corresponding to <em>U</em> = 0.34 mV: gain corrected for <em>R</em> = 10<small><sup>13</sup></small> Ω) for <small><sup>30</sup></small>Si<small><sup>+</sup></small> was determined still maintaining the ability to yield <em>u</em><small><sub>rel</sub></small>(<em>M</em>) = 4 × 10<small><sup>−9</sup></small>. This will also enable the use of smaller sample sizes, which will considerably reduce costs and time and thus improve this method strongly. Tau correction for 10<small><sup>13</sup></small> Ω resistors was studied showing no significant influence in case of the continuous beam experiments.</p>\",\"PeriodicalId\":81,\"journal\":{\"name\":\"Journal of Analytical Atomic Spectrometry\",\"volume\":\" 6\",\"pages\":\" 1540-1550\"},\"PeriodicalIF\":3.1000,\"publicationDate\":\"2024-05-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://pubs.rsc.org/en/content/articlepdf/2024/ja/d4ja00066h?page=search\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Analytical Atomic Spectrometry\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://pubs.rsc.org/en/content/articlelanding/2024/ja/d4ja00066h\",\"RegionNum\":2,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"CHEMISTRY, ANALYTICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Analytical Atomic Spectrometry","FirstCategoryId":"92","ListUrlMain":"https://pubs.rsc.org/en/content/articlelanding/2024/ja/d4ja00066h","RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, ANALYTICAL","Score":null,"Total":0}
引用次数: 0
摘要
在与多集电极电感耦合等离子体质谱仪(MC-ICP-MS)的法拉第探测器相连接的放大器反馈回路中,首次使用高欧姆(1013 Ω)电阻测量了28Si高度富集的硅材料的摩尔质量M和同位素组成。在通过 X 射线晶体密度 (XRCD) 方法实现和推广国际单位制千克和摩尔的背景下,保持和改进最先进的技术,以尽可能低的相关不确定性来测定 M 具有非常重要的意义。通过使用 30Si/29Si 比率范围较大(≈102)的 Si28-33Pr11 晶体,比较了用于离子检测的 1011 Ω 和 1013 Ω 电阻器的应用和影响。30Si 的低丰度妨碍了测量,从而扩大了不确定性。使用 1013 Ω 电阻器可将初始硅样品溶液稀释四倍,从 wx(Si) = 4536 µg/g 降至 1134 µg/g,以保护 MS 设备(离子透镜、狭缝等)。确定 30Si+ 的离子电流 I = 3.4 fA(对应 U = 0.34 mV:R = 1013 Ω 的增益校正)时,wx(Si) ≈ 1134 µg/g 的下限仍能保持 urel(M) = 4 × 10-9。这样还可以使用更小的样本量,大大减少成本和时间,从而有力地改进了这一方法。对 1013 Ω 电阻器的 Tau 校正进行了研究,结果表明对连续束实验没有显著影响。
Comparison and influence of 1011 and 1013 ohm resistors used for MC-ICP-MS determination of isotope ratios in highly enriched silicon†
The molar mass M and isotopic composition of a silicon material highly enriched in 28Si were measured for the first time using high ohmic (1013 Ω) resistors in the feedback loop of amplifiers connected to the Faraday detectors of a multicollector-inductively coupled plasma mass spectrometer (MC-ICP-MS). In the context of the realization and dissemination of the SI units kilogram and mole via the X-ray crystal density (XRCD) method, it is of high importance to maintain and improve the state-of-the art technique to determine M with the lowest possible associated uncertainty. The applications and influences of 1011 Ω and 1013 Ω resistors for ion detection were compared using the crystal Si28-33Pr11 exhibiting a large range (≈102) of the ratio 30Si/29Si. The low abundance of 30Si hampers the measurement and thus enlarges the uncertainty. The use of 1013 Ω resistors enables a fourfold dilution of the initial Si sample stock solutions from wx(Si) = 4536 μg g−1 down to 1134 μg g−1 preserving the MS equipment (ion lenses, slits etc.). A lower limit of wx(Si) ≈ 1134 μg g−1 for ion currents I = 3.4 fA (corresponding to U = 0.34 mV: gain corrected for R = 1013 Ω) for 30Si+ was determined still maintaining the ability to yield urel(M) = 4 × 10−9. This will also enable the use of smaller sample sizes, which will considerably reduce costs and time and thus improve this method strongly. Tau correction for 1013 Ω resistors was studied showing no significant influence in case of the continuous beam experiments.