Ana Almeida, Susana Brás, Susana Sargento, Filipe Cabral Pinto
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Focalize K-NN: an imputation algorithm for time series datasets
The effective use of time series data is crucial in business decision-making. Temporal data reveals temporal trends and patterns, enabling decision-makers to make informed decisions and prevent potential problems. However, missing values in time series data can interfere with the analysis and lead to inaccurate conclusions. Thus, our work proposes a Focalize K-NN method that leverages time series properties to perform missing data imputation. This approach shows the benefits of taking advantage of correlated features and temporal lags to improve the performance of the traditional K-NN imputer. A similar approach could be employed in other methods. We tested this approach with two datasets, various parameter and feature combinations, and observed that it is beneficial in scenarios with disjoint missing patterns. Our findings demonstrate the effectiveness of Focalize K-NN for imputing missing values in time series data. The more noticeable benefits of our methods occur when there is a high percentage of missing data. However, as the amount of missing data increases, so does the error.
期刊介绍:
The journal publishes high quality articles in areas of fundamental research in intelligent pattern analysis and applications in computer science and engineering. It aims to provide a forum for original research which describes novel pattern analysis techniques and industrial applications of the current technology. In addition, the journal will also publish articles on pattern analysis applications in medical imaging. The journal solicits articles that detail new technology and methods for pattern recognition and analysis in applied domains including, but not limited to, computer vision and image processing, speech analysis, robotics, multimedia, document analysis, character recognition, knowledge engineering for pattern recognition, fractal analysis, and intelligent control. The journal publishes articles on the use of advanced pattern recognition and analysis methods including statistical techniques, neural networks, genetic algorithms, fuzzy pattern recognition, machine learning, and hardware implementations which are either relevant to the development of pattern analysis as a research area or detail novel pattern analysis applications. Papers proposing new classifier systems or their development, pattern analysis systems for real-time applications, fuzzy and temporal pattern recognition and uncertainty management in applied pattern recognition are particularly solicited.