E. Yu. Shamparov, A. L. Bugrimov, S. V. Rode, I. N. Jagrina
{"title":"铋薄膜的 Ir 透明度","authors":"E. Yu. Shamparov, A. L. Bugrimov, S. V. Rode, I. N. Jagrina","doi":"10.1134/s0030400x23100223","DOIUrl":null,"url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>The infrared transmission and reflection spectra of a series of samples of bismuth films of different thicknesses on identical single-crystal silicon substrates were measured. Transmission and reflection oscillations caused by interference on the film thickness are investigated. Properties of Si-plates are estimated. Refractive index and absorption index of bismuth are calculated.</p>","PeriodicalId":723,"journal":{"name":"Optics and Spectroscopy","volume":null,"pages":null},"PeriodicalIF":0.8000,"publicationDate":"2024-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Ir Transparency of Thin Bismuth Films\",\"authors\":\"E. Yu. Shamparov, A. L. Bugrimov, S. V. Rode, I. N. Jagrina\",\"doi\":\"10.1134/s0030400x23100223\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<h3 data-test=\\\"abstract-sub-heading\\\">Abstract</h3><p>The infrared transmission and reflection spectra of a series of samples of bismuth films of different thicknesses on identical single-crystal silicon substrates were measured. Transmission and reflection oscillations caused by interference on the film thickness are investigated. Properties of Si-plates are estimated. Refractive index and absorption index of bismuth are calculated.</p>\",\"PeriodicalId\":723,\"journal\":{\"name\":\"Optics and Spectroscopy\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.8000,\"publicationDate\":\"2024-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics and Spectroscopy\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://doi.org/10.1134/s0030400x23100223\",\"RegionNum\":4,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Spectroscopy","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1134/s0030400x23100223","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"OPTICS","Score":null,"Total":0}
The infrared transmission and reflection spectra of a series of samples of bismuth films of different thicknesses on identical single-crystal silicon substrates were measured. Transmission and reflection oscillations caused by interference on the film thickness are investigated. Properties of Si-plates are estimated. Refractive index and absorption index of bismuth are calculated.
期刊介绍:
Optics and Spectroscopy (Optika i spektroskopiya), founded in 1956, presents original and review papers in various fields of modern optics and spectroscopy in the entire wavelength range from radio waves to X-rays. Topics covered include problems of theoretical and experimental spectroscopy of atoms, molecules, and condensed state, lasers and the interaction of laser radiation with matter, physical and geometrical optics, holography, and physical principles of optical instrument making.