Yb3+:YAG 单晶中电荷转移发光的温度依赖性

Q2 Engineering
Yaraslau Padrez , Vitalii Boiko , Juraj Kajan , Tomáš Gregor , Vira Tinkova , Renata Karpicz , Mykhailo Chaika
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引用次数: 0

摘要

电荷转移发光(CTL)过程在 Yb:YAG 激光材料中发挥着重要作用,是降低该材料性能的能量损失源。本文研究了 Yb:YAG 单晶中 CTL 的温度依赖性。激发光源为 375 纳米皮秒激光源。结果表明,温度的变化会影响扰动 F+中心和 Yb3+离子之间 CTL 的发射强度和位置最大值。温度升高导致 CTL 蓝移,而发射强度呈倒 U 型。测得的 CLT 发光寿命在 8 ns - 13 ns 之间,几乎不随温度变化。CTL 参数随温度变化的原因是 F+ 中心之间的能量传递过程和 Yb:YAG 单晶的电荷转移状态发生了变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Temperature dependence of Charge Transfer Luminescence in Yb3+:YAG single crystal

Charge Transfer Luminescence (CTL) processes play a major roles in Yb:YAG laser materials act as a source of energy losses decrease the performance of this material. In this work, the temperature dependence of CTL in Yb:YAG single crystal was investigated. A 375-nm picosecond laser source was used as the excitation source. It was shown that the change in temperature affects the emission intensity and the position maximum of CTL occurring between perturbated F+ centers and Yb3+ ions. The increase in the temperature caused the blueshift of CTL, while the emission intensity have the inverted U-shape. The measured luminescence lifetime of CLT was in the range of 8 ns – 13 ns and barely changes with temperature. The temperature dependence of the CTL parameters was explained by the change in the energy transfer processes between F+ centers and the charge transfer state of Yb:YAG single crystals.

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来源期刊
Optical Materials: X
Optical Materials: X Engineering-Electrical and Electronic Engineering
CiteScore
3.30
自引率
0.00%
发文量
73
审稿时长
91 days
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