混合聚合手术后心房颤动症状减轻、生活质量提高：CONVERGE 试验子分析

{"title":"混合聚合手术后心房颤动症状减轻、生活质量提高：CONVERGE 试验子分析","authors":"Jaswinder Gill, K. Crossen, Christopher Blauth, Faraz Kerendi, S. Oza, A. Magnano, Mark A. Mostovych, Michael E. Halkos, David Tschopp, Jose Osorio, Paul Tabereaux, William Boedefeld, Kenneth Civello, Syed Ahsan, John Yap, Sreedhar R. Billakanty, Steve Duff, Otto Costantini, Eric Espinal, Andy Kiser, Christian Shults, David Pederson, James Garrison, David M. Gilligan, Michael G. Link, Marcin Kowalski, Christopher S. Stees, Jason S. Sperling, Israel Jacobowitz, Felix Yang, Y. Greenberg, D. D. De Lurgio","doi":"10.21037/acs-2023-afm-15","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2024-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Atrial fibrillation symptom reduction and improved quality of life following the hybrid convergent procedure: a CONVERGE trial subanalysis\",\"authors\":\"Jaswinder Gill, K. Crossen, Christopher Blauth, Faraz Kerendi, S. Oza, A. Magnano, Mark A. Mostovych, Michael E. Halkos, David Tschopp, Jose Osorio, Paul Tabereaux, William Boedefeld, Kenneth Civello, Syed Ahsan, John Yap, Sreedhar R. Billakanty, Steve Duff, Otto Costantini, Eric Espinal, Andy Kiser, Christian Shults, David Pederson, James Garrison, David M. Gilligan, Michael G. Link, Marcin Kowalski, Christopher S. Stees, Jason S. Sperling, Israel Jacobowitz, Felix Yang, Y. Greenberg, D. D. De Lurgio\",\"doi\":\"10.21037/acs-2023-afm-15\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2024-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"3\",\"ListUrlMain\":\"https://doi.org/10.21037/acs-2023-afm-15\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"3","ListUrlMain":"https://doi.org/10.21037/acs-2023-afm-15","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}