用于新一代显示器的创新薄膜电子技术

IF 1.7 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Andre Zeumault, Jose E. Mendez, John Brewer
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引用次数: 0

摘要

当今显示器行业面临的晶体管级挑战与 20 世纪 90 年代中期互补金属氧化物半导体(CMOS)金属氧化物半导体场效应晶体管(MOSFET)面临的挑战类似。从 MOSFET 中汲取的经验为显示器行业应对硅基薄膜晶体管 (TFT) 的局限性提供了借鉴。摩尔定律的持续改进促使人们需要重新思考 MOSFET 的材料和结构。显示器行业需要在器件层面进行根本性创新。新型薄膜器件使显示器的应用出现拐点,正如鳍式场效应晶体管 (FinFET) 在 2000 年代确定了 CMOS 的拐点一样。本文概述了薄膜器件技术的两项创新,它们改善了平板显示器的图像质量和功耗:非晶金属栅极 TFT(AMeTFT)和非晶金属非线性电阻器(AMNR)。这两项创新通过以可大规模生产的薄膜非晶金属为基础的单一核心材料集相互连接,创建了简化玻璃(现在)和塑料(未来)上高图像质量、低功耗显示器生产的近期和长期路线图。特别是,氧化铟镓锌 (IGZO) AMeTFT 的场效应迁移率(55-72 cm2/Vs)超过了现有显示器制造商开发的 IGZO TFT,而无需原子层沉积或垂直堆叠异质结构半导体薄膜,这使得 AMeTFT 成为针对 IGZO 背板的新型 G8.5-G8.7 晶圆厂的自然选择。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Innovations in thin-film electronics for the new generation of displays

Innovations in thin-film electronics for the new generation of displays

Today's display industry faces transistor-level challenges similar to those of complementary metal-oxide semiconductor (CMOS) metal-oxide semiconductor field-effect transistors (MOSFETs) in the mid-1990s. Learnings from MOSFETs inform the display industry's response to the limitations of silicon-based thin-film transistors (TFTs). Improvements sustaining Moore's Law drove the need to rethink MOSFET materials and structures. The display industry needs fundamental innovation at the device level. New thin-film devices enable an inflection point in the use of displays, just as fin field-effect transistor (FinFET) defined the inflection point in CMOS in the 2000s. This paper outlines two innovations in thin-film device technology that offers improvement in image quality and power consumption of flat panel displays: amorphous metal gate TFTs (AMeTFTs) and amorphous metal nonlinear resistors (AMNRs). Linked through a single core material set based on mass-producible, thin-film amorphous metals, these two innovations create near- and long-term roadmaps simplifying the production of high-image quality, low-power consumption displays on glass (now) and plastic (future). In particular, the field-effect mobility of indium gallium zinc oxide (IGZO) AMeTFTs (55–72 cm2/Vs) exceeds that of IGZO TFTs developed by existing display manufacturers without the need for atomic layer deposition or vertical stacking of heterostructure semiconductor films, making AMeTFTs a natural choice for the new G8.5–G8.7 fabs targeting IGZO backplanes.

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来源期刊
Journal of the Society for Information Display
Journal of the Society for Information Display 工程技术-材料科学:综合
CiteScore
4.80
自引率
8.70%
发文量
98
审稿时长
3 months
期刊介绍: The Journal of the Society for Information Display publishes original works dealing with the theory and practice of information display. Coverage includes materials, devices and systems; the underlying chemistry, physics, physiology and psychology; measurement techniques, manufacturing technologies; and all aspects of the interaction between equipment and its users. Review articles are also published in all of these areas. Occasional special issues or sections consist of collections of papers on specific topical areas or collections of full length papers based in part on oral or poster presentations given at SID sponsored conferences.
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