利用基于集合树的算法提高后置网表中单元延迟的准确性

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Yassine Attaoui , Mohamed Chentouf , Zine El Abidine Alaoui Ismaili , Aimad El Mourabit
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引用次数: 0

摘要

如今,ASIC 设计越来越复杂,PPA 目标也被逼到了极限。早期设计阶段物理信息的缺乏阻碍了精确的时序预测,并可能导致设计的重新旋转。在之前的工作中,我们使用随机森林模型成功地改进了贴片后阶段的时序预测,单元延迟准确率达到 91.25%。在此基础上,我们进一步研究了基于集合树的算法的潜力,特别是 "极度随机化树 "和 "梯度提升",以缩小单元延迟准确性方面的差距。在本文中,我们使用新的 16 纳米工业设计来丰富训练数据集。结果表明,该方法有了很大改进,平均单元延迟准确率达到 92.01%,未见数据的准确率为 84.26%。平均均方根误差从 12.11 显著降低到 3.23,未见数据上的误差为 7.76。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Enhancing cell delay accuracy in post-placed netlists using ensemble tree-based algorithms

Nowadays, the ASIC design is increasing in complexity, and PPA targets are pushed to the limit. The lack of physical information at the early design stages hinders precise timing predictions and may lead to design re-spins. In previous work, we successfully improved timing prediction at the post-placement stage using the Random Forest model, achieving 91.25% cell delay accuracy. Building upon this, we further investigate the potential of Ensemble Tree-based algorithms, specifically focusing on “Extremely Randomized Trees” and “Gradient Boosting”, to close the gap in cell delay accuracy. In this paper, we enrich the training dataset with new 16 nm industrial designs. The results demonstrate a substantial improvement, with an average cell delay accuracy of 92.01% and 84.26% on unseen data. The average Root-Mean-Square-Error is significantly reduced from 12.11 to 3.23 and 7.76 on unseen data.

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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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