用于高速应用的低功耗施密特触发器驱动 10T SRAM 单元

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Lokesh Soni, Neeta Pandey
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引用次数: 0

摘要

本文介绍了一种单面施密特触发器驱动的 10 晶体管(ST 10T)静态随机存取存储器单元(SRAM),该单元功耗更低、读写访问时间更长、保持和写入稳定性更好。通过使用施密特触发器逆变器和功率门控方法,它具有更好的读写访问时间和稳定性。具有堆叠效应的单位线结构降低了所提出电池的漏功率。与所考虑的结构相比,所提出的 ST 10T 单元的功耗最大可降低 9667.52 倍。此外,写入能力和保持稳定性也分别提高了 1.62 倍和 1.17 倍。该单元的读写访问时间分别缩短了 1.66 倍和 45.85 倍。蒙特卡洛(MC)仿真证明了拟议单元的弹性性能。仿真采用 Cadence Virtuoso GPDK 45 纳米 CMOS 技术进行。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

A low power Schmitt-trigger driven 10T SRAM Cell for high speed applications

A low power Schmitt-trigger driven 10T SRAM Cell for high speed applications

A single-sided Schmitt-trigger driven 10-transistor (ST 10T) static random access memory cell (SRAM) exhibiting lower power consumption, better read and write access time, improved hold and write stability are presented. Using a Schmitt-trigger inverter and a power gating approach, it has better read and write access time and stability. The single bitline structure with stacking effect lowers the proposed cell’s leakage power. The proposed ST 10T cell has a maximum reduction in power consumption of up to 9667.52 times than the considered structure. Furthermore, improvements in write ability and hold stability of up to 1.62 and 1.17 times respectively, are obtained over compared SRAM cells. The cell reduces read and write access times by up to 1.66 and 45.85 times, respectively. The Monte-Carlo (MC) simulations demonstrate the proposed cell’s resilient performance. The simulation is performed using Cadence Virtuoso GPDK 45 nm CMOS technology.

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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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