利用选择性特征关注和像素洗牌金字塔改进 PCB 缺陷检测

{"title":"利用选择性特征关注和像素洗牌金字塔改进 PCB 缺陷检测","authors":"Ka Chun Fung, Kai-Wen Xue, Cheung-Ming Lai, Kwan-Ho Lin, Kin-Man Lam","doi":"10.1016/j.rineng.2024.101992","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":505830,"journal":{"name":"Results in Engineering","volume":"332 2","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improving PCB defect detection using selective feature attention and pixel shuffle pyramid\",\"authors\":\"Ka Chun Fung, Kai-Wen Xue, Cheung-Ming Lai, Kwan-Ho Lin, Kin-Man Lam\",\"doi\":\"10.1016/j.rineng.2024.101992\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":505830,\"journal\":{\"name\":\"Results in Engineering\",\"volume\":\"332 2\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Results in Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1016/j.rineng.2024.101992\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Results in Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/j.rineng.2024.101992","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}