MixFace:改进人脸验证,关注细粒度条件

IF 1.3 4区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Junuk Jung, Sungbin Son, Joochan Park, Yongjun Park, Seonhoon Lee, Heung-Seon Oh
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引用次数: 0

摘要

由于卷积神经网络(CNNs)的快速发展,人脸识别(FR)的性能在公共基准数据集上已经达到了一个高峰,如野外标记人脸(LFW)、野外名人正面轮廓(CFP-FP)和首个人工收集的野外年龄数据库(AgeDB)。然而,由于缺乏相关数据集,各种细粒度条件下的人脸对 FR 模型的影响尚未得到研究。本文使用 K-FACE(最近推出的具有细粒度条件的 FR 数据集)分析了不同条件和损失函数下的影响。我们提出了一种名为 MixFace 的新型损失函数,它结合了分类损失和度量损失。通过使用各种基准数据集,实验证明了 MixFace 在有效性和鲁棒性方面的优越性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

MixFace: Improving face verification with a focus on fine-grained conditions

MixFace: Improving face verification with a focus on fine-grained conditions

The performance of face recognition (FR) has reached a plateau for public benchmark datasets, such as labeled faces in the wild (LFW), celebrities in frontal-profile in the wild (CFP-FP), and the first manually collected, in-the-wild age database (AgeDB), owing to the rapid advances in convolutional neural networks (CNNs). However, the effects of faces under various fine-grained conditions on FR models have not been investigated, owing to the absence of relevant datasets. This paper analyzes their effects under different conditions and loss functions using K-FACE, a recently introduced FR dataset with fine-grained conditions. We propose a novel loss function called MixFace, which combines classification and metric losses. The superiority of MixFace in terms of effectiveness and robustness was experimentally demonstrated using various benchmark datasets.

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来源期刊
ETRI Journal
ETRI Journal 工程技术-电信学
CiteScore
4.00
自引率
7.10%
发文量
98
审稿时长
6.9 months
期刊介绍: ETRI Journal is an international, peer-reviewed multidisciplinary journal published bimonthly in English. The main focus of the journal is to provide an open forum to exchange innovative ideas and technology in the fields of information, telecommunications, and electronics. Key topics of interest include high-performance computing, big data analytics, cloud computing, multimedia technology, communication networks and services, wireless communications and mobile computing, material and component technology, as well as security. With an international editorial committee and experts from around the world as reviewers, ETRI Journal publishes high-quality research papers on the latest and best developments from the global community.
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