波长为 810 nm 的二极管激光能否减轻无症状坏死上颌切牙患者牙髓治疗后的疼痛?一项四臂随机对照试验。

IF 2.5 Q2 DENTISTRY, ORAL SURGERY & MEDICINE
Mohammad Tamer Abbara, Samar Akil, Omar Hamadah, Hassan Achour, Ghina Mahayni, Yasser Alsayed Tolibah
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引用次数: 0

摘要

目的:在一次就诊治疗中,找到应用 810 纳米二极管激光缓解上颌切牙根尖周炎坏死后疼痛的最佳方法:80名被诊断为无症状根尖牙周炎的坏死切牙患者接受标准化的清洁和塑形程序,然后按1:1:1:1的分配比例随机分为四组:第一组:不使用激光的对照组;第二组:使用二极管激光作为灌洗激活系统(IAS);第三组:从颊腭粘膜使用二极管激光;第四组:使用二极管激光作为灌洗激活系统并从颊腭粘膜使用。治疗后 1、3、7 和 14 天,使用视觉模拟量表(VAS)对术后疼痛进行评估。VAS 评分的平均值采用 Kruskal-Walis 和 Mann-Whitney U 检验进行统计分析。显著性水平设定为 a = 0.05:结果:在治疗后的 14 天内,四组 VAS 评分的平均值之间存在显著的统计学差异(P 值):与对照组相比,使用二极管激光作为 IAS 或 LLLT 可减少坏死牙和大面积根尖病变治疗后的术后疼痛。此外,在之前的两种技术中,二极管激光的使用代表了在 14 天治疗期间缓解术后疼痛的最佳方案:本研究的临床意义在于探讨使用 810 纳米二极管激光减轻术后疼痛的最佳方法;本研究的结果表明,LLLT 和 IAS 中的二极管激光照射量越大,牙髓治疗术后的疼痛就越轻。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Can diode laser 810 nm decrease post endodontic pain in patients with asymptomatic necrotic maxillary incisors? A four-arm randomized controlled trial.

Can diode laser 810 nm decrease post endodontic pain in patients with asymptomatic necrotic maxillary incisors? A four-arm randomized controlled trial.

Aim: To find the best method for applying the diode laser 810 nm to relieve post-endodontic pain on necrotic maxillary incisors with periapical lesions within a single-visit treatment.

Methods: Eighty patients with a necrotic incisor, diagnosed with asymptomatic apical periodontitis, received standardized cleaning and shaping procedures, then divided randomly with a 1:1:1:1 allocation ratio into four groups: Group 1: control group with no laser application, Group 2: applying the diode laser as an irrigation activation system (IAS), Group 3: applying the diode laser from the buccal and palatal mucosa, Group 4: applying the diode laser as an IAS and from buccal and palatal mucosa. The postoperative pain was assessed using the visual analog scale (VAS) 1, 3, 7, and 14 days after the treatment. The mean values of the VAS score were statistically analyzed used Kruskal-Walis and Mann-Whitney U tests. The level of significance was set at a = 0.05.

Results: During 14 days after treatment, there was a statistically significant difference between mean values of VAS scores in the four groups (P value < 0.05); Group 1 scored the highest score, whereas Group 4 showed the lowest one. Moreover, Group 4 showed favorable outcomes compared with Group 2 and Group 3 during the first three days after treatment.

Conclusion: Diode laser reduced postoperative pain after necrotic teeth with large-sized apical lesion treatment, whereas using diode laser either as an IAS or LLLT reduced the postoperative pain compared with the control group. Moreover, the usage of a diode laser in both previous techniques represents the best protocol for postoperative pain relief during 14 days of treatment.

Clinical relevance: The clinical significance of this study is to investigate the best method to reduce postoperative pain using diode lasers 810 nm; where the results of this study indicated that the more diode laser exposer in LLLT and IAS, the less postoperative pain after endodontic procedures.

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来源期刊
BDJ Open
BDJ Open Dentistry-Dentistry (all)
CiteScore
3.70
自引率
3.30%
发文量
34
审稿时长
30 weeks
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