碳纳米管对铜/(锡-银-铜)焊点中 Cu6Sn5 形态的影响

Minho Oh, Hiroka Iwamoto, Equo Kobayashi
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引用次数: 0

摘要

本研究深入探讨了多壁碳纳米管(MWCNTs)与锡银铜焊料体系之间错综复杂的相互作用,强调了其在无铅焊接应用中的相关性。回流和等温老化会在接合界面形成金属间层,包括 Cu6Sn5、Cu3Sn 和不规则形状的 Ag3Sn 颗粒。添加 MWCNT 后,Cu6Sn5 晶粒变得扁平,抑制了它们的生长,并有可能提高机械强度。值得注意的是,MWCNT 与 Ag3Sn 的亲和力相对较高。晶粒尺寸分布分析表明,MWCNT 减小了晶粒尺寸,有效抑制了金属间化合物的生长。随着时间的推移,晶粒尺寸会因等温老化过程中同时发生的粗化和生长而增大。在 SAC305-MWCNTs 焊点中金属间化合物的生长动力学分析中,在 Cu6Sn5 和 Cu 之间固态扩散的驱动下,观察到 Cu3Sn 生长的稳定行为。相反,随着温度的变化,Cu6Sn5 的生长行为会出现显著变化。此外,对 Cu/(SAC305-MWCNTs) 和 Cu/SAC305 扩散耦合中 Cu3Sn 生长的活化焓进行评估后发现,层生长的幂函数 n 值和 k 值相似,这表明 Cu3Sn 生长具有相似的速率控制过程。焊料中 MWCNT 的存在对 Cu3Sn 生长的速率控制过程或活化焓没有显著影响,这与观察到的对 Cu6Sn5 生长的影响形成鲜明对比。这项研究为了解 SAC305-MWCNTs 焊料体系内的相互作用提供了宝贵的见解,对无铅焊接应用具有重要意义。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Influence of carbon nanotubes on the morphology of Cu6Sn5 in Cu/(Sn–Ag–Cu) solder joints

Influence of carbon nanotubes on the morphology of Cu6Sn5 in Cu/(Sn–Ag–Cu) solder joints

This study delves into the intricate interaction between multi-walled carbon nanotubes (MWCNTs) and the Sn–Ag–Cu solder system, highlighting its relevance in lead-free soldering applications. Reflow and isothermal aging induce the formation of intermetallic layers at the joint interface, including Cu6Sn5, Cu3Sn, and irregularly shaped Ag3Sn particles. The addition of MWCNTs leads to the flattening of Cu6Sn5 grains, restraining their growth and potentially improving mechanical strength. Notably, MWCNTs exhibit a relatively high affinity with Ag3Sn. Grain size distribution analysis indicates that MWCNTs reduce particle size, effectively suppressing intermetallic compound growth. Over time, grain size increases due to simultaneous coarsening and growth during isothermal aging. In the growth kinetics analysis of intermetallic compounds in SAC305-MWCNTs solder joints, stable behavior is observed for Cu3Sn growth, driven by solid-state diffusion between Cu6Sn5 and Cu. In contrast, Cu6Sn5 exhibits significant variations in growth behavior with temperature changes. Furthermore, the evaluation of activation enthalpy for Cu3Sn growth in the Cu/(SAC305-MWCNTs) and Cu/SAC305 diffusion couples reveals similar n and k values of the power function for the layer growth, indicating a comparable rate-controlling process for Cu3Sn growth. The presence of MWCNTs in the solder does not significantly influence the rate-controlling process or activation enthalpy for Cu3Sn growth, contrasting with the observed effects on Cu6Sn5 growth. This study provides valuable insights into the interactions within the SAC305-MWCNTs solder system, offering significant implications for lead-free soldering applications.

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