{"title":"具有单抽头推测式 DFE 和宽频率捕获范围的 16 Gb/s 波特率 CDR 电路","authors":"Po-Yuan Chou;Wei-Ming Chen;Shen-Iuan Liu","doi":"10.1109/TVLSI.2024.3353197","DOIUrl":null,"url":null,"abstract":"A 16-Gb/s baud-rate clock and data recovery (CDR) circuit with a one-tap decision-feedback equalizer (DFE) and a wide frequency capture range (FCR) is presented. The proposed asymmetrical pattern-based phase detectors are used to achieve a wide FCR. This quarter-rate CDR circuit is fabricated in 40-nm CMOS technology and the active area is 0.1094 mm2. For a 16 Gb/s PRBS of 27–1, the power of the CDR circuit is 38.4 mW and its calculated energy efficiency is 2.4 pJ/b. The measured FCR is 40.6%.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"32 3","pages":"480-484"},"PeriodicalIF":2.8000,"publicationDate":"2024-01-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A 16-Gb/s Baud-Rate CDR Circuit With One-Tap Speculative DFE and Wide Frequency Capture Range\",\"authors\":\"Po-Yuan Chou;Wei-Ming Chen;Shen-Iuan Liu\",\"doi\":\"10.1109/TVLSI.2024.3353197\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 16-Gb/s baud-rate clock and data recovery (CDR) circuit with a one-tap decision-feedback equalizer (DFE) and a wide frequency capture range (FCR) is presented. The proposed asymmetrical pattern-based phase detectors are used to achieve a wide FCR. This quarter-rate CDR circuit is fabricated in 40-nm CMOS technology and the active area is 0.1094 mm2. For a 16 Gb/s PRBS of 27–1, the power of the CDR circuit is 38.4 mW and its calculated energy efficiency is 2.4 pJ/b. The measured FCR is 40.6%.\",\"PeriodicalId\":13425,\"journal\":{\"name\":\"IEEE Transactions on Very Large Scale Integration (VLSI) Systems\",\"volume\":\"32 3\",\"pages\":\"480-484\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2024-01-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Very Large Scale Integration (VLSI) Systems\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10414412/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10414412/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
A 16-Gb/s Baud-Rate CDR Circuit With One-Tap Speculative DFE and Wide Frequency Capture Range
A 16-Gb/s baud-rate clock and data recovery (CDR) circuit with a one-tap decision-feedback equalizer (DFE) and a wide frequency capture range (FCR) is presented. The proposed asymmetrical pattern-based phase detectors are used to achieve a wide FCR. This quarter-rate CDR circuit is fabricated in 40-nm CMOS technology and the active area is 0.1094 mm2. For a 16 Gb/s PRBS of 27–1, the power of the CDR circuit is 38.4 mW and its calculated energy efficiency is 2.4 pJ/b. The measured FCR is 40.6%.
期刊介绍:
The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society.
Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels.
To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.