{"title":"(Part.Part.Syst.Charact.2/2024)","authors":"","doi":"10.1002/ppsc.202470027","DOIUrl":null,"url":null,"abstract":"Cover image provided courtesy of Tymish Y. Ohulchanskyy, Junle Qu, Anderson S. L. Gome, and co-workers.","PeriodicalId":19903,"journal":{"name":"Particle & Particle Systems Characterization","volume":null,"pages":null},"PeriodicalIF":2.7000,"publicationDate":"2024-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"(Part. Part. Syst. Charact. 2/2024)\",\"authors\":\"\",\"doi\":\"10.1002/ppsc.202470027\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Cover image provided courtesy of Tymish Y. Ohulchanskyy, Junle Qu, Anderson S. L. Gome, and co-workers.\",\"PeriodicalId\":19903,\"journal\":{\"name\":\"Particle & Particle Systems Characterization\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.7000,\"publicationDate\":\"2024-02-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Particle & Particle Systems Characterization\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1002/ppsc.202470027\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"CHEMISTRY, PHYSICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Particle & Particle Systems Characterization","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1002/ppsc.202470027","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
引用次数: 0
摘要
封面图片由 Tymish Y. Ohulchanskyy、Junle Qu、Anderson S. L. Gome 及合作者提供。
期刊介绍:
Particle & Particle Systems Characterization is an international, peer-reviewed, interdisciplinary journal focusing on all aspects of particle research. The journal joined the Advanced Materials family of journals in 2013. Particle has an impact factor of 4.194 (2018 Journal Impact Factor, Journal Citation Reports (Clarivate Analytics, 2019)).
Topics covered include the synthesis, characterization, and application of particles in a variety of systems and devices.
Particle covers nanotubes, fullerenes, micelles and alloy clusters, organic and inorganic materials, polymers, quantum dots, 2D materials, proteins, and other molecular biological systems.
Particle Systems include those in biomedicine, catalysis, energy-storage materials, environmental science, micro/nano-electromechanical systems, micro/nano-fluidics, molecular electronics, photonics, sensing, and others.
Characterization methods include microscopy, spectroscopy, electrochemical, diffraction, magnetic, and scattering techniques.