来自分段 STEM 探测器的氮化镓原子电场：实验与模拟

IF 1.5 4区工程技术 Q3 MICROSCOPY

Journal of microscopy Pub Date : 2024-02-19 DOI:10.1111/jmi.13276

Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Christoph Mahr, Beeke Gerken, Marco Schowalter, Bert Freitag, Andreas Rosenauer

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引用次数: 0

摘要

利用 Spectra 300 显微镜中的 12 段 STEM 探测器，在 4D 扫描透射电子显微镜（4D-STEM）中采用质量中心法测量了氮化镓薄样品中的原子电场。电场、电荷密度和电势与使用像素化 4D-STEM 探测器进行的模拟和实验测量结果进行了比较。分段探测器具有记录速度快的优点，可以在低辐射剂量下进行测量。不过，由于本研究分析的分段数量有限，因此存在测量不确定性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

GaN atomic electric fields from a segmented STEM detector: Experiment and simulation

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GaN atomic electric fields from a segmented STEM detector: Experiment and simulation

Atomic electric fields in a thin GaN sample are measured with the centre-of-mass approach in 4D-scanning transmission electron microscopy (4D-STEM) using a 12-segmented STEM detector in a Spectra 300 microscope. The electric fields, charge density and potential are compared to simulations and an experimental measurement using a pixelated 4D-STEM detector. The segmented detector benefits from a high recording speed, which enables measurements at low radiation doses. However, there is measurement uncertainty due to the limited number of segments analysed in this study.

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来源期刊

Journal of microscopy 工程技术-显微镜技术

CiteScore

4.30

自引率

5.00%

发文量

审稿时长

1 months

期刊介绍： The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.