光谱积分法 (SIM) 用于任意数量的圆形 PEC 圆柱散射

Qing Huo Liu;Siwei Wan;Chunhui Zhu
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引用次数: 0

摘要

我们提出了一种精确的光谱积分法(SIM),用于分析多个圆形完美电导体(PEC)圆柱体的散射。它利用傅里叶级数和加法定理解耦系统,从而求解耦合表面积分方程。SIM 具有指数收敛性,因此误差会随着表面样本密度的增加而呈指数下降,而且只需要每波长约 2-3 个点(PPW)就能达到工程精度,即高于 99% 的精度(或误差小于 1%)。数值结果表明,SIM 比矩法(MoM)更精确、更高效,因此有可能用作有限元和谱元法中的精确辐射边界条件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Spectral Integral Method (SIM) for the Scattering from an Arbitrary Number of Circular PEC Cylinders
We present an accurate spectral integral method (SIM) for the analyses of scattering from multiple circular perfect electric conductor (PEC) cylinders. It solves the coupled surface integral equations by using the Fourier series and addition theorem to decouple the system. The SIM has exponential convergence so that the error decreases exponentially with the sample density on the surfaces, and requires only about 2–3 points per wavelength (PPW) to reach engineering accuracy defined as higher than 99% accuracy (or with an error smaller than 1%). Numerical results demonstrate that the SIM is much more accurate and efficient than the method of moments (MoM), and thus can be potentially used as the exact radiation boundary condition in the finite element and spectral element methods.
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