Yelin Ni, Tucker T. Bisel, Md Kamrul Hasan, Donghui Li, Witold K. Fuchs, Scott K. Cooley, Larry Nichols, Matt Pharr, Nathalie Dupuy, Sylvain R. A. Marque, Mark K. Murphy, Suresh D. Pillai, Samuel Dorey, Leonard S. Fifield
{"title":"作者更正:乙烯-醋酸乙烯(EVA)/乙烯-乙烯醇(EVOH)/EVA 薄膜与伽马射线、电子束和 X 射线辐照的兼容性","authors":"Yelin Ni, Tucker T. Bisel, Md Kamrul Hasan, Donghui Li, Witold K. Fuchs, Scott K. Cooley, Larry Nichols, Matt Pharr, Nathalie Dupuy, Sylvain R. A. Marque, Mark K. Murphy, Suresh D. Pillai, Samuel Dorey, Leonard S. Fifield","doi":"10.1038/s41529-024-00433-1","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":19270,"journal":{"name":"npj Materials Degradation","volume":null,"pages":null},"PeriodicalIF":6.6000,"publicationDate":"2024-01-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.nature.com/articles/s41529-024-00433-1.pdf","citationCount":"0","resultStr":"{\"title\":\"Author Correction: Compatibility of ethylene vinyl acetate (EVA)/ethylene vinyl alcohol (EVOH)/EVA films with gamma, electron-beam, and X-ray irradiation\",\"authors\":\"Yelin Ni, Tucker T. Bisel, Md Kamrul Hasan, Donghui Li, Witold K. Fuchs, Scott K. Cooley, Larry Nichols, Matt Pharr, Nathalie Dupuy, Sylvain R. A. Marque, Mark K. Murphy, Suresh D. Pillai, Samuel Dorey, Leonard S. Fifield\",\"doi\":\"10.1038/s41529-024-00433-1\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":19270,\"journal\":{\"name\":\"npj Materials Degradation\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":6.6000,\"publicationDate\":\"2024-01-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.nature.com/articles/s41529-024-00433-1.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"npj Materials Degradation\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://www.nature.com/articles/s41529-024-00433-1\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"npj Materials Degradation","FirstCategoryId":"88","ListUrlMain":"https://www.nature.com/articles/s41529-024-00433-1","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
Author Correction: Compatibility of ethylene vinyl acetate (EVA)/ethylene vinyl alcohol (EVOH)/EVA films with gamma, electron-beam, and X-ray irradiation
期刊介绍:
npj Materials Degradation considers basic and applied research that explores all aspects of the degradation of metallic and non-metallic materials. The journal broadly defines ‘materials degradation’ as a reduction in the ability of a material to perform its task in-service as a result of environmental exposure.
The journal covers a broad range of topics including but not limited to:
-Degradation of metals, glasses, minerals, polymers, ceramics, cements and composites in natural and engineered environments, as a result of various stimuli
-Computational and experimental studies of degradation mechanisms and kinetics
-Characterization of degradation by traditional and emerging techniques
-New approaches and technologies for enhancing resistance to degradation
-Inspection and monitoring techniques for materials in-service, such as sensing technologies